Abstract The present invention allows for calibration of a scanning probe microscope under computer control. The present invention comprehends either the removal of nonlinear artifacts in the microscope output data after measurement has been taken (a off-line process), or the correction of nonlinear movements in the microscope scanner such that the scanner moves in a linear fashion during measurement (a realtime process). The realtime process may be operated in both an open-loop and a closed-loop process. The processes of the present invention uses an average cross-section of the scan in order to simplify the calculation and to improve the signal-to-noise ratio. Interpolation methods and centroid calculations are used to locate features on the scanned sample to subpixel precision. Comparison of the measured scan feature positions with the known topography of the scanned calibration specimen enable the present invention to assemble a calibrated length scale which may be used to correct individual feature positions in a full two-dimensional scan, each scan line in a two-dimensional image, or an average cross-section of the two-dimensional scan.
A method for high precision calibration and feature measurement for use with a scanning probe microscope, comprising the steps of: a) scanning a calibration specimen in order to create a two-dimensional calibration data array; b) generating a one-dimensional calibration profile by calculating an average cross-section of the calibration data array; c) measuring first feature locations in the calibration profile; d) creating a calibrated length scale by comparing the first feature locations to a known topography of the calibration specimen; e) scanning a measurement specimen in order to create a two-dimensional measurement data array; f) applying the calibrated length scale to the two-dimensional measurement data array in order to correct nonlinearities in the measurement data array in at least one direction; and g) displaying the corrected measurement data array to a user.
Claim 2
Independent Claim
131 words
A method for high precision calibration and feature measurement for use with a scanning probe microscope, comprising the steps of: a) scanning a calibration specimen in order to create a two-dimensional calibration data array; b) generating a one-dimensional calibration profile by calculating an average cross-section of the calibration data array; c) measuring first feature locations in the calibration profile; d) creating a calibrated length scale by comparing the first feature locations to a known topography of the calibration specimen; e) scanning a measurement specimen in order to create a two-dimensional measurement data array; f) applying the calibrated length scale to the two-dimensional measurement data array in order to correct nonlinearities in the measurement data array in at least one direction; and g) displaying the corrected measurement data array to a user.