Semiconductor device in a thin active layer with high breakdown voltage

Claim 2

A semiconductor device in a thin active layer with high breakdown voltage and having charge carrier depleted regions of reduced electrical field strength comprising: a substrate; a component region of a semiconductor material carried by the substrate and having an upper surface and a lower surface and being weakly doped with a first type of doping material; a dielectric isolating layer delimiting the lower surface of the component region from the substrate; a separation layer extending along from, back, left and right surfaces of the component region; in the component region, a bipolar transistor which is connected in series to a field effect transistor; a base region of the bipolar transistor in the component region that has a relatively low concentration of a second type of doping material which is opposite to the first type of doping material and that extends from the upper surface of the component region; a PN-junction at a bottom surface of the base region bordering a part of the component region; and a plurality of electrical connections, wherein when electrical voltages are applied to the electrical connections the regions of reduced electrical field strength are depleted of charge carriers, a first one of the charge carrier depleted regions extending from the PN-junction to the dielectric isolating layer, at least beneath a part of the base region; wherein the base region surrounds an emitter region of the bipolar transistor which is heavily doped with the first type of doping material and which is connected to a first one of the electrical connections; the base region has a base connection region which is heavily doped with the second type of doping material and which is connected to a second one of the electrical connections; the base connection region includes a gate connection region for the field effect transistor; a collector region of the bipolar transistor and a source region of the field effect transistor are provided in the component region; and the field effect transistor has a drain connection region that is heavily doped with the first type of doping material and that is connected to a third one of the electrical connections, such that when electrical voltages are applied to the first, second, and third electrical connections, an electrical field strength in the first charge carrier depleted region is less than a breakdown field strength of the semiconductor device; and wherein the separation layer has dielectric isolating walls on the front and back surfaces of the component region; two projections extend from the base region in the component region along the front and back surfaces; and a second one of the charge carrier depleted regions extends between the projections.

Claim 3

The semiconductor device according to claim 1, wherein ends of the projections proximate to the base region have cross-section widths that are greater than cross-section widths of other ends of the projections.

Claim 4

A semiconductor device in a thin active layer with high breakdown voltage and having charge carrier depleted regions of reduced electrical field strength comprising: a substrate; a component region of a semiconductor material carried by the substrate and having an upper surface and a lower surface and being weakly doped with a first type of doping material; a dielectric isolating layer delimiting the lower surface of the component region from the substrate; a separation layer extending along front, back, left and right surfaces of the component region; in the component region, a bipolar transistor which is connected in series to a first field effect transistor; a base region of the bipolar transistor in the component region that has a relatively low concentration of a second type of doping material which is opposite to the first type of doping material and that extends from the upper surface of the component region; a PN-junction at a bottom surface of the base region bordering a part of the component region; and a plurality of electrical connections in the component region, wherein when electrical voltages are applied to the electrical connections the regions of reduced electrical field strength are depleted of charge carriers, a first one of the charge carrier depleted regions extending from the PN-junction to the dielectric isolating layer, at least beneath a part of the base region; wherein the base region surrounds an emitter region of the bipolar transistor which is heavily doped with the first type of doping material and which is connected to a first one of the electrical connections; the base region has a base connection region which is heavily doped with the second type of doping material and which is connected to a second one of the electrical connections; the base connection region includes a gate connection region for the first field effect transistor; a collector region of the bipolar transistor and a source region of the first field effect transistor are provided in the component region; the first field effect transistor has a drain connection region that is heavily doped with the first type of doping material and that is connected to a third one of the electrical connections, such that when electrical voltages are applied to the first, second, and third electrical connections, an electrical field strength in the first charge carrier depleted region is less than a breakdown field strength of the semiconductor device; and a second field effect transistor connected in parallel to said first field effect transistor has a gate connected to a fourth one of the electrical connections, such that when an electrical voltage is applied to the fourth electrical connection the electric field of the semiconductor device is redistributed; and wherein the separation layer has dielectric isolating walls on the front and back surfaces of the component region; two projections extend from the base region in the component region along the front and back surfaces; and a second one of the charge carrier depleted regions extends between the projections.

Claim 5

A semiconductor device in a thin active layer with high breakdown voltage and having charge carrier depleted regions of reduced electrical field strength comprising: a substrate; a component region of a semiconductor material carried by the substrate and having an upper surface and a lower surface and being weakly doped with a first type of doping material; a dielectric isolating layer delimiting the lower surface of the component region from the substrate; a separation layer extending along front, back, left and right surfaces of the component region; in the component region, a bipolar transistor which is connected in series to a first field effect transistor; a base region of the bipolar transistor in the component region that has a relatively low concentration of a second type of doping material which is opposite to the first type of doping material and that extends from the upper surface of the component region; a PN-junction at a bottom surface of the base region bordering a part of the component region; and a plurality of electrical connections in the component region, wherein when electrical voltages are applied to the electrical connections the regions of reduced electrical field strength are depleted of charge carriers, a first one of the charge carrier depleted regions extending from the PN-junction to the dielectric isolating layer, at least beneath a part of the base region; wherein the base region surrounds an emitter region of the bipolar transistor which is heavily doped with the first type of doping material and which is connected to a first one of the electrical connections; the base region has a base connection region which is heavily doped with the second type of doping material and which is connected to a second one of the electrical connections; the base connection region includes a gate connection region for the first field effect transistor; a collector region of the bipolar transistor and a source region of the first field effect transistor are provided in the component region; the first field effect transistor has a drain connection region that is heavily doped with the first type of doping material and that is connected to a third one of the electrical connections, such that when electrical voltages are applied to the first, second, and third electrical connections, an electrical field strength in the first charge carrier depleted region is less than a breakdown field strength of the semiconductor device; and a second field effect transistor connected in parallel to said first field effect transistor has a gate connected to a fourth one of the electrical connections, such that when an electrical voltage is applied to the fourth electrical connection the electric field of the semiconductor device is redistributed; and wherein the separation layer has dielectric isolating walls on the front and back surfaces of the component region; two projections extend from the base region in the component region along the front and back surfaces; and a second one of the charge carrier depleted regions extends between the projections.

Claim 6

The semiconductor device according to claim 3, wherein the gate of the second field effect transistor underlies the component region.

Claim 7

The semiconductor device according to claim 3, wherein ends of the projections proximate to the base region have cross-section widths that are greater than cross-section widths of other ends of the projections.