Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
197 words
A compare circuit for a content-addressable memory, said compare circuit comprising: a first storage node line and a second storage node line connecting to a memory cell of said content-addressable memory for determining a state of said memory cell, wherein said first storage node line and said second storage node line are complementary to each other; a first compare line and a second compare line, wherein said first compare line and said second compare line are complementary to each other; a first set of four transistors connected to said first compare line and connected in series to be enabled by a logical one from said first storage node line for allowing a signal from said first compare line to propagate to an output; and a second set of four transistors connected to said second compare line and connected in series to be enabled by a logical zero from said first storage node line for allowing a signal from said second compare line to propagate to said output such that a signal from either of said first compare line and second compare line needs to propagate through only one level of transistors in order to reach said output.
Claim 2
Dependent Claim
197 words
A compare circuit for a content-addressable memory, said compare circuit comprising: a first storage node line and a second storage node line connecting to a memory cell of said content-addressable memory for determining a state of said memory cell, wherein said first storage node line and said second storage node line are complementary to each other; a first compare line and a second compare line, wherein said first compare line and said second compare line are complementary to each other; a first set of four transistors connected to said first compare line and connected in series to be enabled by a logical one from said first storage node line for allowing a signal from said first compare line to propagate to an output; and a second set of four transistors connected to said second compare line and connected in series to be enabled by a logical zero from said first storage node line for allowing a signal from said second compare line to propagate to said output such that a signal from either of said first compare line and second compare line needs to propagate through only one level of transistors in order to reach said output.
Claim 3
Dependent Claim
26 words
The compare circuit for a content-addressable memory according to claim 1, wherein said first set of four transistors includes two p-channel transistors and two n-channel transistors.
Claim 4
Dependent Claim
39 words
The compare circuit for a content-addressable memory according to claim 2, wherein one of said two p-channel transistors is connected to V dd and one of said two n-channel transistors is connected to ground voltage or V ss .
Claim 5
Dependent Claim
26 words
The compare circuit for a content-addressable memory according to claim 1, wherein said second set of four transistors includes two p-channel transistors and two n-channel transistors.
Claim 6
Dependent Claim
39 words
The compare circuit for a content-addressable memory according to claim 4, wherein one of said two p-channel transistors is connected to V dd and one of said two n-channel transistors is connected to ground voltage or V ss .
Claim 7
Dependent Claim
139 words
A compare circuit for a content-addressable memory, said compare circuit comprising: a first compare line and a second compare line; a first inverter connected to said first compare line and connected in series with a first two enabling transistors, wherein said first inverter connected to said first compare line and is enabled by a logical one from a first storage node of said content-addressable memory for allowing a signal from said first compare line to propagate to an output; and a second inverter connected to said second compare line and connected in series with a second two enabling transistors, wherein said second inverter connected to said second compare line and is enabled by a logical zero from said first storage node of said content-addressable memory for allowing a signal from said second compare line to propagate to said output.
Claim 8
Dependent Claim
139 words
A compare circuit for a content-addressable memory, said compare circuit comprising: a first compare line and a second compare line; a first inverter connected to said first compare line and connected in series with a first two enabling transistors, wherein said first inverter connected to said first compare line and is enabled by a logical one from a first storage node of said content-addressable memory for allowing a signal from said first compare line to propagate to an output; and a second inverter connected to said second compare line and connected in series with a second two enabling transistors, wherein said second inverter connected to said second compare line and is enabled by a logical zero from said first storage node of said content-addressable memory for allowing a signal from said second compare line to propagate to said output.
Claim 9
Dependent Claim
39 words
The compare circuit for a content-addressable memory according to claim 6, wherein said first inverter includes a first p-channel transistor and a first n-channel transistor and said second inverter includes a second p-channel transistor and a second n-channel transistor.
Claim 10
Dependent Claim
47 words
The compare circuit for a content-addressable memory according to claim 7, wherein one of said first two enabling transistors is connected between V dd and said first p-channel transistor, wherein one of said second two enabling transistors is connected between V dd and said second p-channel transistor.
Claim 11
Dependent Claim
37 words
The compare circuit for a content-addressable memory according to claim 7, wherein a drain of said first n-channel transistors is connected to a source of said first p-channel transistor by a level of polysilicon and two contacts.
Claim 12
Dependent Claim
131 words
A content-addressable memory comprising: a memory cell having a pair of complementary storage node lines; a compare circuit connecting to said memory cell via said pair of complementary storage node lines, said compare circuit including a pair of complementary compare lines as inputs, wherein said compare circuit includes a first set of four transistors connected in series to be enabled by a logical one from said memory cell and a second set of four transistors connected in series to be enabled by a logical zero from said memory cell; and a match line connecting to an output of said compare circuit, wherein compare signals for said pair of complementary compare lines needs to propagate through only one of said first set or second set of transistors for controlling said match line.
Claim 13
Dependent Claim
131 words
A content-addressable memory comprising: a memory cell having a pair of complementary storage node lines; a compare circuit connecting to said memory cell via said pair of complementary storage node lines, said compare circuit including a pair of complementary compare lines as inputs, wherein said compare circuit includes a first set of four transistors connected in series to be enabled by a logical one from said memory cell and a second set of four transistors connected in series to be enabled by a logical zero from said memory cell; and a match line connecting to an output of said compare circuit, wherein compare signals for said pair of complementary compare lines needs to propagate through only one of said first set or second set of transistors for controlling said match line.
Claim 14
Dependent Claim
27 words
The content-addressable memory of claim 10, wherein each of said first set of transistors and second set of transistors includes two p-channel transistors and two n-channel transistors.