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US5730940A Expired / Lapsed US ⏱️ 0.0 years remaining

Scanning probe microscope and molecular processing method using the scanning probe microscope

Assignee: Panasonic Holdings Corp
•
Filing: 1994-11-15
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Granted: 1998-03-24
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Expires: 2014-11-15
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Abstract

Abstract This invention relates to a scanning probe microscope which examines or processes directly the structure of substance surfaces at the molecular or atomic level, and a method for processing molecules using a scanning probe microscope and a method for detecting DNA base arrangement. A scanning probe microscope has a probe approaching or contacting the substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is interacted or chemically reacted between the substance surface and the molecules or atom groups which act as a sensor and are fixed on the probe, scanning at an atomic level of precision. Therefore, surface structure within a microscopic region can be examined or processed at the molecular or atomic level. A method for detecting DNA base arrangement with any one of three or four kinds of probes fixed with any one of four different kinds of molecules interacting four kinds of bases consisting of DNA, by approaching single stranded DNA fixed on a substrate, measuring the force and scanning by an atomic force microscope at an atomic level of precision.

Inventors

  • 👤 Tohru Nakagawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 07:47
CPC Classifications
G; G01; G01Q; G01Q60/00; G01Q60/60; B; B82; B82Y; B82Y35/00; G01Q60/24; G01Q60/38; G01Q60/42; B82Y30/00; Y; Y10; Y10S; Y10S977/00; Y10S977/70; Y10S977/724; Y10S977/727; Y10S977/728; Y10S977/84; Y10S977/849; Y10S977/852; Y10S977/853; Y10S977/86; Y10S977/875; Y10S977/877; Y10S977/879; Y10S977/88; Y10S977/881; Y10S977/902; Y10S977/904; Y10S977/924; Y10S977/932; Y10S977/953; Y10S977/957; Y10S977/958

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 85 words
A scanning probe microscope comprising a probe approaching or contacting a substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is chemically reacted between the substance surface and molecules or atom groups which act as a sensor are fixed on the probe, and the probe is scanned at an atomic level of precision, wherein the scanning probe microscope is a scanning electrochemical microscope and the physical quantity to be detected is an electric current.
Claim 2
Dependent Claim 85 words
A scanning probe microscope comprising a probe approaching or contacting a substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is chemically reacted between the substance surface and molecules or atom groups which act as a sensor are fixed on the probe, and the probe is scanned at an atomic level of precision, wherein the scanning probe microscope is a scanning electrochemical microscope and the physical quantity to be detected is an electric current.
Claim 3
Independent Claim 75 words
A method for processing molecules of a substance surface at the molecular or atomic level comprising chemically reacting molecules or atom groups of the substance surface with molecules or atom groups fixed to the scanning probe and detecting a physical quantity which is measured through the probe by approaching or contacting the substance surface, wherein the molecules are processed with a scanning electrochemical microscope and the physical quantity to be detected is an electric current.
Claim 4
Independent Claim 75 words
A method for processing molecules of a substance surface at the molecular or atomic level comprising chemically reacting molecules or atom groups of the substance surface with molecules or atom groups fixed to the scanning probe and detecting a physical quantity which is measured through the probe by approaching or contacting the substance surface, wherein the molecules are processed with a scanning electrochemical microscope and the physical quantity to be detected is an electric current.
Claim 5
Dependent Claim 25 words
A scanning probe microscope according to claim 1, wherein the molecules, which act as a sensor, and the probe are covalently bonded to each other.
Claim 6
Dependent Claim 21 words
A scanning probe microscope according to claim 3, wherein the molecules which act as a sensor form a chemically adsorbed film.
Claim 7
Dependent Claim 28 words
A scanning probe microscope according to claim 1, wherein the molecules which act as a sensor are contained in a metal electrodeposited on the surface of the probe.
Claim 8
Dependent Claim 23 words
A method according to claim 2, wherein the molecules, which act as a sensor, and the probe are covalently bonded to each other.
Claim 9
Dependent Claim 19 words
A method according to claim 6, wherein the molecules which act as a sensor form a chemically adsorbed film.
Claim 10
Dependent Claim 26 words
A method according to claim 2, wherein the molecules which act as a sensor are contained in a metal electrodeposited on the surface of the probe.

References Cited (Backward Citations)

US4724318A Cited
JPS63304103A Cited
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EP0397416A1 Cited
GB2235049A Cited
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EP0410618A2 Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-03-23 2001-09-22 2002-03-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-03-23 2005-09-22 2006-03-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-03-23 2009-09-22 2010-03-24 $7700.00 Window Closed / Lapsed

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