Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
234 words
A plasma processing method comprising the steps of: preparing a plasma processing apparatus comprising a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated, said substrate mounting region being made in an island region surrounded by a groove portion, an outside shape of said island region being smaller than that of said specified substrate, and said groove portion extending under an insulative cover, which is provided on said first electrode apart from and surrounding said substrate mounting region, and being filled with an insulator such that a surface of said insulator is equal to or lower than that of said substrate mounting region, a chamber for containing said first electrode, gas introducing means for introducing a reactive gas into said chamber, gas exhausting means for exhausting said gas from said chamber, a second electrode provided inside said chamber, power supply means for supplying high-frequency power between said first electrode and said second electrode and said insulative cover whose inner periphery surrounds said substrate, for covering a surface of said first electrode other than said substrate mounting region; mounting said specified substrate on said substrate mounting region of said first electrode in such a manner that said specified substrate completely covers said substrate mounting region; introducing said gas into said chamber; and supplying said high-frequency power between said first electrode and said second electrode.
Claim 2
Dependent Claim
234 words
A plasma processing method comprising the steps of: preparing a plasma processing apparatus comprising a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated, said substrate mounting region being made in an island region surrounded by a groove portion, an outside shape of said island region being smaller than that of said specified substrate, and said groove portion extending under an insulative cover, which is provided on said first electrode apart from and surrounding said substrate mounting region, and being filled with an insulator such that a surface of said insulator is equal to or lower than that of said substrate mounting region, a chamber for containing said first electrode, gas introducing means for introducing a reactive gas into said chamber, gas exhausting means for exhausting said gas from said chamber, a second electrode provided inside said chamber, power supply means for supplying high-frequency power between said first electrode and said second electrode and said insulative cover whose inner periphery surrounds said substrate, for covering a surface of said first electrode other than said substrate mounting region; mounting said specified substrate on said substrate mounting region of said first electrode in such a manner that said specified substrate completely covers said substrate mounting region; introducing said gas into said chamber; and supplying said high-frequency power between said first electrode and said second electrode.
Claim 3
Dependent Claim
49 words
The plasma processing method according to claim 1, wherein said step of preparing a plasma processing apparatus includes a step of making a surface of said insulative cover to be substantially flush with that of said specified substrate, when said specified substrate is mounted on said substrate mounting region.
Claim 4
Dependent Claim
37 words
The plasma processing method according to claim 1, wherein an impedance of said insulative cover to a high frequency of said high-frequency power is substantially equal to an impedance of said specified substrate to the high frequency.
Claim 5
Dependent Claim
23 words
The plasma processing method according to claim 1, wherein said gas introduced into said chamber is a gas for etching said specified substrate.
Claim 6
Dependent Claim
209 words
A plasma processing method comprising the steps of: preparing a plasma processing apparatus comprising a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated, said substrate mounting region being formed as a concave portion which is larger than an outside shape of said specified substrate, a chamber for containing said first electrode, gas introducing means for introducing a reactive gas into said chamber, gas exhausting means for exhausting said reactive gas from said chamber, a second electrode provided in said chamber, power supply means for supplying high-frequency power between said first electrode and said second electrode and an insulative cover for covering at least a surface of said first electrode other than said substrate mounting region, said cover having hook portions to fix said specified substrate to said substrate mounting region and being formed with a thickness such that an electric field over said specified substrate is substantially uniform, mounting said specified substrate on said substrate mounting region of said first electrode and then fixing said substrate to said first electrode with said hook of said insulative cover; introducing said reactive gas into said chamber; and supplying said high-frequency power between said first electrode and said second electrode.
Claim 7
Dependent Claim
209 words
A plasma processing method comprising the steps of: preparing a plasma processing apparatus comprising a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated, said substrate mounting region being formed as a concave portion which is larger than an outside shape of said specified substrate, a chamber for containing said first electrode, gas introducing means for introducing a reactive gas into said chamber, gas exhausting means for exhausting said reactive gas from said chamber, a second electrode provided in said chamber, power supply means for supplying high-frequency power between said first electrode and said second electrode and an insulative cover for covering at least a surface of said first electrode other than said substrate mounting region, said cover having hook portions to fix said specified substrate to said substrate mounting region and being formed with a thickness such that an electric field over said specified substrate is substantially uniform, mounting said specified substrate on said substrate mounting region of said first electrode and then fixing said substrate to said first electrode with said hook of said insulative cover; introducing said reactive gas into said chamber; and supplying said high-frequency power between said first electrode and said second electrode.
Claim 8
Dependent Claim
200 words
A plasma processing apparatus comprising: a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated; a chamber for containing said first electrode; gas introducing means for introducing a reactive gas into said chamber; gas exhausting means for exhausting said reactive gas from said chamber; a second electrode constituted of one of a metal portion of said chamber and a metal plate provided inside said chamber; power supply means for supplying high-frequency power between said first electrode and said second electrode; and an insulative cover whose inner periphery surrounds said substrate, for covering a surface of said first electrode other than said substrate mounting region, wherein said substrate mounting region is an island region surrounded by a groove portion and an outside shape of said island region is smaller than that of said specified substrate, said groove portion extends under said insulative cover and is filled with an insulator such that a surface of said insulator is equal to or lower than that of said substrate mounting region, in order that said specified substrate is mounted on said substrate mounting region so as to completely cover said substrate mounting region.
Claim 9
Dependent Claim
200 words
A plasma processing apparatus comprising: a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated; a chamber for containing said first electrode; gas introducing means for introducing a reactive gas into said chamber; gas exhausting means for exhausting said reactive gas from said chamber; a second electrode constituted of one of a metal portion of said chamber and a metal plate provided inside said chamber; power supply means for supplying high-frequency power between said first electrode and said second electrode; and an insulative cover whose inner periphery surrounds said substrate, for covering a surface of said first electrode other than said substrate mounting region, wherein said substrate mounting region is an island region surrounded by a groove portion and an outside shape of said island region is smaller than that of said specified substrate, said groove portion extends under said insulative cover and is filled with an insulator such that a surface of said insulator is equal to or lower than that of said substrate mounting region, in order that said specified substrate is mounted on said substrate mounting region so as to completely cover said substrate mounting region.
Claim 10
Dependent Claim
35 words
The plasma processing apparatus according to claim 6, wherein said groove portion is formed such that an outer periphery thereof is located 2 mm or more outward from an inner periphery of said insulative cover.
Claim 11
Dependent Claim
169 words
A plasma processing apparatus comprising: a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated; a chamber for containing said first electrode; gas introducing means for introducing a reactive gas into said chamber; gas exhausting means for exhausting said gas from said chamber; a second electrode constituted of one of a metal portion of said chamber and a metal plate provided inside said chamber; power supply means for supplying high-frequency power between said first electrode and said second electrode; and an insulative cover for covering at least a surface of said first electrode other than said substrate mounting region, said cover having hook portions to fix said specified substrate to said substrate mounting region, wherein said substrate mounting region is formed as a concave portion which is larger than an outside shape of said specified substrate, and wherein said insulative cover is formed with a thickness such that an electric field over said specified substrate is substantially uniform.
Claim 12
Dependent Claim
169 words
A plasma processing apparatus comprising: a first electrode which is substantially flat and has a substrate mounting region mounted with a specified substrate to be treated; a chamber for containing said first electrode; gas introducing means for introducing a reactive gas into said chamber; gas exhausting means for exhausting said gas from said chamber; a second electrode constituted of one of a metal portion of said chamber and a metal plate provided inside said chamber; power supply means for supplying high-frequency power between said first electrode and said second electrode; and an insulative cover for covering at least a surface of said first electrode other than said substrate mounting region, said cover having hook portions to fix said specified substrate to said substrate mounting region, wherein said substrate mounting region is formed as a concave portion which is larger than an outside shape of said specified substrate, and wherein said insulative cover is formed with a thickness such that an electric field over said specified substrate is substantially uniform.