Claims Analysis
Total Claims: 54
Claim 1
Independent Claim
119 words
An integrated circuit comprising: a memory array of memory cells with diode-like conduction characteristics for at least one of two memory cell data states, the array having at least one layer of word lines and at least one layer of bit lines, the bit lines on each bit line layer organized in at least one group; at least one noise detection line associated with each layer of bit lines; a selection circuit for selecting one of a group of bit lines, and for selecting a noise detection line associated with the group of bit lines; and a bit line sensing circuit responsive to a signal on the selected bit line and a signal on the selected noise detection line.
Claim 2
Dependent Claim
119 words
An integrated circuit comprising: a memory array of memory cells with diode-like conduction characteristics for at least one of two memory cell data states, the array having at least one layer of word lines and at least one layer of bit lines, the bit lines on each bit line layer organized in at least one group; at least one noise detection line associated with each layer of bit lines; a selection circuit for selecting one of a group of bit lines, and for selecting a noise detection line associated with the group of bit lines; and a bit line sensing circuit responsive to a signal on the selected bit line and a signal on the selected noise detection line.
Claim 3
Dependent Claim
23 words
The invention defined in claim 1 wherein: each noise detection line is arranged so that memory cells coupled respectively thereto are substantially non-conductive.
Claim 4
Dependent Claim
17 words
The invention defined in claim 1 wherein: memory cells forming each noise detection line are substantially non-conductive.
Claim 5
Dependent Claim
17 words
The invention defined in claim 1 wherein: the bit line sensing circuit comprises a voltage sensing circuit.
Claim 6
Dependent Claim
52 words
The invention defined in claim 4 wherein the voltage sensing circuit comprises: a first precharge circuit for precharging the selected noise detection line to an unselected word line bias voltage; and a second precharge circuit for precharging the selected bit line to a voltage other than the unselected word line bias voltage.
Claim 7
Dependent Claim
21 words
The invention defined in claim 5 wherein: the second precharge circuit is configured to precharge the selected bit line to ground.
Claim 8
Dependent Claim
17 words
The invention defined in claim 1 wherein: the bit line sensing circuit comprises a current sensing circuit.
Claim 9
Dependent Claim
27 words
The invention defined in claim 1 wherein: the selection circuit is arranged so that a selected bit line is never adjacent to a selected noise detection line.
Claim 10
Dependent Claim
26 words
The invention defined in claim 1 wherein: the selection circuit is arranged so that a selected bit line is never adjacent to another selected bit line.
Claim 11
Dependent Claim
40 words
The invention defined in claim 1 wherein: the selection circuit is arranged so that a selected bit line within a first group of bit lines is never adjacent to a selected bit line within a second group of bit lines.
Claim 12
Dependent Claim
14 words
The invention defined in claim 1 wherein the memory cells comprise a semiconductor material.
Claim 13
Dependent Claim
14 words
The invention defined in claim 1 wherein the memory cells comprise an organic polymer.
Claim 14
Dependent Claim
15 words
The invention defined in claim 1 wherein the memory cells comprise a phase change material.
Claim 15
Dependent Claim
14 words
The invention defined in claim 1 wherein the memory cells comprise an amorphous solid.
Claim 16
Dependent Claim
14 words
The invention defined in claim 1 wherein the memory cells comprise an anti-fuse layer.
Claim 17
Dependent Claim
14 words
The invention defined in claim 1 wherein the memory cells comprise a fuse layer.
Claim 18
Dependent Claim
40 words
The invention defined in claim 1 wherein: the bit lines on each bit line layer are arranged in at least two groups, each group associated with a respective selection circuit and sensing circuit on a respective side of the array.
Claim 19
Dependent Claim
40 words
The invention defined in claim 17 wherein: a single noise detection line is associated with more than one group of bit lines on a bit line layer and is selectable by the respective selection circuit for more than one group.
Claim 20
Dependent Claim
39 words
The invention defined in claim 17 wherein: each respective group of bit lines on a bit line layer is associated with at least one respective noise detection line which is not also associated with at least one other group.
Claim 21
Dependent Claim
34 words
The invention defined in claim 17 wherein: each noise detection line is arranged so that each memory cell coupled respectively thereto is arranged to conduct negligible current when an associated word line is selected.
Claim 22
Dependent Claim
25 words
The invention defined in claim 1 wherein: each group of bit lines on a bit line layer includes a pair of associated noise detection lines.
Claim 23
Dependent Claim
59 words
The invention defined in claim 21 wherein: half the respective memory cells on each noise detection line are arranged to conduct current when a respectively associated word line is selected, and the remaining half of the respective memory cells on each noise detection line are arranged to not conduct significant current when a respectively associated word line is selected.
Claim 24
Dependent Claim
26 words
The invention defined in claim 22 wherein: the memory cells on each noise detection line are programmed during manufacture to provide testing of memory cell programmability.
Claim 25
Dependent Claim
20 words
The invention defined in claim 23 wherein: the memory cells on each noise detection line are write-once programmable memory cells.
Claim 26
Dependent Claim
38 words
The invention defined in claim 21 wherein: for a given word line, the associated memory cell on one but not the other of the pair of noise detection lines associated with a group of bit lines is conductive.
Claim 27
Dependent Claim
30 words
The invention defined in claim 25 wherein: the selection circuit is arranged to select the noise detection line whose memory cell associated with the selected word line is not conductive.
Claim 28
Dependent Claim
38 words
The invention defined in claim 17 wherein: the selection circuit is arranged so that a noise detection line adjacent to a selected bit line is never selected, irrespective of which group of bit lines each is associated with.
Claim 29
Dependent Claim
37 words
The invention defined in claim 17 wherein: the selection circuit is arranged so that a selected bit line is never adjacent to another selected bit line, irrespective of which group of bit lines each is associated with.
Claim 30
Dependent Claim
66 words
The invention defined in claim 1 wherein: the bit lines on each bit line layer are arranged in at least two groups, each group associated with a respective selection circuit and sensing circuit on a respective side of the array; and each respective group of bit lines on a bit line layer includes a respective pair of noise detection lines exclusively associated with the respective group.
Claim 31
Dependent Claim
59 words
The invention defined in claim 29 wherein: half the respective memory cells on each noise detection line are arranged to conduct current when a respectively associated word line is selected, and the remaining half of the respective memory cells on each noise detection line are arranged to not conduct significant current when a respectively associated word line is selected.
Claim 32
Dependent Claim
110 words
An integrated circuit comprising: a multi-level memory array of programmable anti-fuse memory cells, having at least one layer of word lines and more than one layer of bit lines, the bit lines on each bit line layer organized in at least one group; at least one noise detection line associated with each layer of bit lines; a selection circuit for selecting, on a selected layer, one bit line of a group of bit lines, and a noise detection line associated with the group of bit lines; and a bit line sensing circuit responsive to a signal on the selected noise detection line and a signal on the selected bit line.
Claim 33
Dependent Claim
110 words
An integrated circuit comprising: a multi-level memory array of programmable anti-fuse memory cells, having at least one layer of word lines and more than one layer of bit lines, the bit lines on each bit line layer organized in at least one group; at least one noise detection line associated with each layer of bit lines; a selection circuit for selecting, on a selected layer, one bit line of a group of bit lines, and a noise detection line associated with the group of bit lines; and a bit line sensing circuit responsive to a signal on the selected noise detection line and a signal on the selected bit line.
Claim 34
Dependent Claim
16 words
The invention defined in claim 31 wherein: memory cells on each noise detection line remain unprogrammed.
Claim 35
Dependent Claim
17 words
The invention defined in claim 31 wherein: the bit line sensing circuit comprises a voltage sensing circuit.
Claim 36
Dependent Claim
17 words
The invention defined in claim 31 wherein: the bit line sensing circuit comprises a current sensing circuit.
Claim 37
Dependent Claim
38 words
The invention defined in claim 31 wherein: the selection circuit is arranged so that a selected bit line on a bit line layer is never adjacent to a selected noise detection line on the same bit line layer.
Claim 38
Dependent Claim
37 words
The invention defined in claim 31 wherein: the selection circuit is arranged so that a selected bit line on a bit line layer is never adjacent to another selected bit line on the same bit line layer.
Claim 39
Dependent Claim
68 words
The invention defined in claim 31 wherein: alternating bit lines on a bit line layer form a first group and are associated with a selection circuit and sensing circuit disposed to one side of the array, and remaining bit lines on the layer form a second group and are associated with a selection circuit and sensing circuit disposed to a side of the array opposite the one side.
Claim 40
Dependent Claim
26 words
The invention defined in claim 37 wherein: each respective group of bit lines on a bit line layer is associated with a respective noise detection line.
Claim 41
Dependent Claim
16 words
The invention defined in claim 37 wherein: memory cells on each noise detection line remain unprogrammed.
Claim 42
Dependent Claim
38 words
The invention defined in claim 37 wherein: the selection circuit is arranged so that a selected bit line is never adjacent to a selected noise detection line, irrespective of which group of bit lines each is associated with.
Claim 43
Dependent Claim
37 words
The invention defined in claim 37 wherein: the selection circuit is arranged so that a selected bit line is never adjacent to another selected bit line, irrespective of which group of bit lines each is associated with.
Claim 44
Dependent Claim
20 words
The invention defined in claim 37 further comprising: more than one selection circuit associated with each group of bit lines.
Claim 45
Dependent Claim
24 words
The invention defined in claim 37 wherein: the memory array is arranged with a word-line layer as the bottom-most layer of the memory array.
Claim 46
Dependent Claim
35 words
The invention defined in claim 37 wherein: more than one noise detection line is associated with each selection circuit and sensing circuit; and a noise detection line nearest to a selected bit line is selected.
Claim 47
Dependent Claim
28 words
The invention defined in claim 31 wherein: each respective group of bit lines on a bit line layer is associated with a respective pair of noise detection lines.
Claim 48
Dependent Claim
33 words
The invention defined in claim 45 wherein: half the memory cells on each noise detection line are programmed, and the remaining half of the memory cells on each noise detection line are unprogrammed.
Claim 49
Dependent Claim
27 words
The invention defined in claim 46 wherein: the programmed memory cells on each noise detection line are programmed during manufacture to test programmability of write-once memory cells.
Claim 50
Dependent Claim
38 words
The invention defined in claim 46 wherein: for a given word line, the associated memory cell on one but not the other of the pair of noise detection lines associated with a group of bit lines is programmed.
Claim 51
Dependent Claim
29 words
The invention defined in claim 48 wherein: the selection circuit is arranged to select the noise detection line whose memory cell associated with the selected word line is unprogrammed.
Claim 52
Dependent Claim
103 words
An integrated circuit comprising: a multi-level memory array of programmable anti-fuse memory cells, having at least one layer of word lines and more than one layer of bit lines; at least one noise detection line associated with each layer of bit lines; means for selecting a bit line on a layer and for selecting a noise detection line associated with the selected bit line; means for comparing a noise current on the selected noise detection line plus a reference current, to a current on the selected bit line comprising a selected memory cell current and a noise current on the selected bit line.
Claim 53
Dependent Claim
103 words
An integrated circuit comprising: a multi-level memory array of programmable anti-fuse memory cells, having at least one layer of word lines and more than one layer of bit lines; at least one noise detection line associated with each layer of bit lines; means for selecting a bit line on a layer and for selecting a noise detection line associated with the selected bit line; means for comparing a noise current on the selected noise detection line plus a reference current, to a current on the selected bit line comprising a selected memory cell current and a noise current on the selected bit line.
Claim 54
Dependent Claim
33 words
The invention defined in claim 50 wherein: the reference current has a magnitude between a current level corresponding to a programmed memory cell and a current level corresponding to an unprogrammed memory cell.