Patent US4140572A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4140572A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for selective etching of polymeric materials embodying silicones therein

Assignee: General Electric Co
•
Filing: 1976-09-07
•
Granted: 1979-02-20
•
Expires: 1996-09-07
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Titanium is employed as a masking material for the selective etching of a coating material of a polyimide-silicone copolymer disposed on selective surface areas of electronic devices.

Inventors

  • 👤 Leonard Stein

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 22:37
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/6922; H10P14/63; H10P14/6326; H10P14/6342; H10P50/00; H10P50/20; H10P50/26; H10P50/262; H10P50/28; H10P50/286; H10P50/287; H10W; H10W20/00; H10W20/01; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/945; Y10S438/948; Y10S438/95

Claims Analysis

Total Claims: 24
Claim 1
Independent Claim 299 words
A method for the selective chemical etching of a cured layer of a silicone-polyimide copolymer material disposed on a surface of a body to open windows therein to expose selected surface portions of the surface thereat including the process steps of: (a) forming a layer of a cured silicone-polyimide copolymer material on a processed body of semiconductor material, the copolymer material consisting of a reaction product of a silicon-free organic diamine, an organic tetracarboxylic dianhydride and a polysiloxane which when cured has the recurring structural units of the formula: ##STR8## with from 5 to 40 mol percent intercondensed structural units of the formula: ##STR9## wherein: R is a divalent hydrocarbon radical; R' is a monovalent hydrocarbon radical; R" is a tetravalent organic radical; Q is a divalent silicon-free organic radical which is the residue of an organic diamine; x is an integer having a value of 1-4, and m and n are integers greater than 1; (b) depositing a layer of titanium metal of a predetermined thickness on the layer of silicone-polyimide copolymer material; (c) depositing a positive photoresist material on the layer of titanium; (d) processing the layer of photoresist material to open one or more windows therein to expose a selected surface area of the layer of titanium metal thereat; (e) chemically etching the exposed titanium metal selectively in fluoboric acid to open one or more windows therein, aligned with the respective windows in the layer of photoresist, to expose selected surface areas of the layer of silicone-polyimide copolymer material thereat, and (f) chemically etching the layer of silicone-polyimide copolymer material selectively in a phenol bearing solution to open one or more windows in the copolymer layer, aligned with the respective windows of the layer of titanium, to expose the selected surface areas of the surface thereat.
Claim 2
Independent Claim 299 words
A method for the selective chemical etching of a cured layer of a silicone-polyimide copolymer material disposed on a surface of a body to open windows therein to expose selected surface portions of the surface thereat including the process steps of: (a) forming a layer of a cured silicone-polyimide copolymer material on a processed body of semiconductor material, the copolymer material consisting of a reaction product of a silicon-free organic diamine, an organic tetracarboxylic dianhydride and a polysiloxane which when cured has the recurring structural units of the formula: ##STR8## with from 5 to 40 mol percent intercondensed structural units of the formula: ##STR9## wherein: R is a divalent hydrocarbon radical; R' is a monovalent hydrocarbon radical; R" is a tetravalent organic radical; Q is a divalent silicon-free organic radical which is the residue of an organic diamine; x is an integer having a value of 1-4, and m and n are integers greater than 1; (b) depositing a layer of titanium metal of a predetermined thickness on the layer of silicone-polyimide copolymer material; (c) depositing a positive photoresist material on the layer of titanium; (d) processing the layer of photoresist material to open one or more windows therein to expose a selected surface area of the layer of titanium metal thereat; (e) chemically etching the exposed titanium metal selectively in fluoboric acid to open one or more windows therein, aligned with the respective windows in the layer of photoresist, to expose selected surface areas of the layer of silicone-polyimide copolymer material thereat, and (f) chemically etching the layer of silicone-polyimide copolymer material selectively in a phenol bearing solution to open one or more windows in the copolymer layer, aligned with the respective windows of the layer of titanium, to expose the selected surface areas of the surface thereat.
Claim 3
Dependent Claim 22 words
The method of claim 1 including the additional process steps after (f) of: (g) disposing the processed body in an acetone bath.
Claim 4
Dependent Claim 30 words
The method of claim 1 including the further process step after selectively chemically etching the layer of titanium of stripping the layer of photoresist material from the layer of titanium.
Claim 5
Dependent Claim 18 words
The method of claim 2 wherein the etching of the layer of titanium is practiced at room temperature.
Claim 6
Dependent Claim 14 words
The method of claim 2 wherein the acetone bath is agitated by ultrasonic means.
Claim 7
Dependent Claim 24 words
The method of claim 2 including the further process step of stripping the layer of titanium from the copolymer material layer in fluoroboric acid.
Claim 8
Dependent Claim 18 words
The method of claim 1 wherein the layer of titanium is of the order of 1000A in thickness.
Claim 9
Dependent Claim 20 words
The method of claim 7 wherein the layer of silicone-polyimide copolymer material is from 1 to 10 microns in thickness.
Claim 10
Dependent Claim 20 words
The method of claim 1 wherein etching of the copolymer material is in the solution maintained at about 60° C.
Claim 11
Dependent Claim 14 words
The method of claim 3 wherein the acetone bath is agitated by ultrasonic means.
Claim 12
Dependent Claim 28 words
The method of claim 1 wherein a stripping of the layer of photoresist material from the titanium is practiced simultaneously with selective chemical etching of the copolymer material.
Claim 13
Dependent Claim 19 words
The method of claim 5 wherein the thickness of the copolymer layer is from 1 micron to 10 microns.
Claim 14
Dependent Claim 23 words
The method of claim 1 wherein the polymeric material is the reaction product of benzophenone tetracarboxylic acid dianhydride with methylene dianiline and bis(-γ-aminopropyl)tetramethyl-disiloxane.
Claim 15
Dependent Claim 18 words
The method of claim 13 wherein the mol percent of intercondensed structural units is from 25 to 35.
Claim 16
Dependent Claim 16 words
The method of claim 14 wherein the mol percent of intercondensed structural units is about 30.
Claim 17
Dependent Claim 22 words
The method of claim 13 including the additional process step after (f) of: (g) disposing the processed body in an acetone bath.
Claim 18
Dependent Claim 18 words
The method of claim 16 wherein the etching of the layer of titanium is practiced at room temperature.
Claim 19
Dependent Claim 42 words
The method of claim 17 wherein the acetone bath is agitated by ultrasonic means to stop the etching action of the etchant, to remove traces of the etchant solution, and to cleanse the exposed surfaces of the element and the copolymer material.
Claim 20
Dependent Claim 24 words
The method of claim 16 including the further process step of stripping the layer of titanium from the copolymer material layer in fluoboric acid.
Claim 21
Dependent Claim 18 words
The method of claim 13 wherein the layer of titanium is of the order of 1000A in thickness.
Claim 22
Dependent Claim 20 words
The method of claim 20 wherein the layer of silicone-polyimide copolymer material is from 1 to 10 microns in thickness.
Claim 23
Dependent Claim 20 words
The method of claim 13 wherein etching of the copolymer material is in the solution maintained at about 60° C.
Claim 24
Dependent Claim 20 words
The method of claim 14 wherein the layer of silicone-polyimide copolymer material is from 1 to 10 microns in thickness.

References Cited (Backward Citations)

US3024138A Cited
US3416962A Cited
US3817844A Cited
US3615913A Cited
US3657029A Cited
US3640778A Cited
US3890177A Cited
US3770560A Cited
US3926911A Cited
US3871929A Cited
US3978578A Cited
US3962004A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-02-19 1982-08-21 1983-02-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-02-19 1986-08-21 1987-02-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-02-19 1990-08-21 1991-02-20 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag