Patent US4397543A successfully refreshed from Google Patents.
US4397543A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Mask for imaging a pattern of a photoresist layer, method of making said mask, and use thereof in a photolithographic process
Assignee: International Business Machines Corp
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Filing: 1981-09-08
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Granted: 1983-08-09
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Expires: 2001-09-08
Abstract
Abstract The invention relates to a mask for imaging a pattern on a photoresist layer, with at least one alignment mark, to a method of making such a mask, and use of these masks for making semiconductor components. The masks made in accordance with the invention are obtained in such manner that in their production the patterns of adjacent chip fields are imaged to the effect that they overlap in their border lines containing the alignment marks. The process produces alignment marks representing the mean of at least two alignment marks of adjacent chip fields. By means of the above specified manufacturing process, the opto-mechanical imaging defects observed during mask production can be substantially eliminated. The masks as disclosed by the invention can be aligned in semiconductor processes with more precision than prior art masks.
Inventors
- 👤 Hartmut F. Kolbe
- 👤 Frank A. Schwarzbach
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 20:55
CPC Classifications
G; G03; G03F; G03F9/00; G03F9/70; G03F1/00; G03F1/38; G03F1/42; G03F1/50
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
91 words
Mask for imaging a pattern on a photoresist layer disposed on a semiconductor wafer having border lines separating chip fields, said mask including at least one alignment mark arranged in that mask area corresponding to said border lines on said semiconductor wafer, characterized in that the said at least one alignment mark represents the mean of at least two alignment marks of adjacent mask areas, said mean being the area formed by the one portion of adjacent alignment mark superimposed on a portion of at least one other adjacent alignment mark.
Claim 2
Dependent Claim
91 words
Mask for imaging a pattern on a photoresist layer disposed on a semiconductor wafer having border lines separating chip fields, said mask including at least one alignment mark arranged in that mask area corresponding to said border lines on said semiconductor wafer, characterized in that the said at least one alignment mark represents the mean of at least two alignment marks of adjacent mask areas, said mean being the area formed by the one portion of adjacent alignment mark superimposed on a portion of at least one other adjacent alignment mark.
Claim 3
Dependent Claim
30 words
Mask as claimed in claim 1, characterized in that the alignment mark is arranged in that area of the mask which corresponds to the border lines on the semiconductor wafer.
Claim 4
Dependent Claim
35 words
Mask according to claim 1 characterized in that the said alignment mark is arranged in the area of the point of intersection of the border line with the middle line of the said chip fields.
Claim 5
Dependent Claim
29 words
Mask according to claim 1 characterized in that the alignment mark is arranged in the area of the border lines in the corners of the said individual chip fields.
Claim 6
Dependent Claim
18 words
Mask according to claim 1 characterized in that said mask consists of a multitude of identical chip fields.
Claim 7
Dependent Claim
13 words
Mask according to claim 1 characterized in that said masks consists of chromium.
Claim 8
Dependent Claim
71 words
Method of making a mask for imaging a pattern on a photoresist layer with at least one alignment mask, characterized in that a reticle with the patterns of the respective chip field and of the alignment mark is periodically imaged with an n-fold reduction on a glass plate with a chromium and a photoresist layer, that the photoresist layer is developed, and the chromium layer is etched through the photoresist mask.
Claim 9
Dependent Claim
71 words
Method of making a mask for imaging a pattern on a photoresist layer with at least one alignment mask, characterized in that a reticle with the patterns of the respective chip field and of the alignment mark is periodically imaged with an n-fold reduction on a glass plate with a chromium and a photoresist layer, that the photoresist layer is developed, and the chromium layer is etched through the photoresist mask.
Claim 10
Dependent Claim
59 words
Method as claimed in claim 7, characterized in that the photochemical exposure of the recticle is effected in such a manner that the alignment marks of the one row of chip fields are superimposed by the alignment marks of the following row of chip fields, and that alignment marks are formed as a mean of at least two exposures.
Claim 11
Dependent Claim
30 words
Method as claimed in claim 7 characterized in that the alignment marks are imaged in that area of the mask which corresponds to the border line on the semiconductor wafer.
Claim 12
Dependent Claim
20 words
Use of masks with alignment marks made in accordance with claim 7, in a photolithographic process for making semiconductor components.
References Cited (Backward Citations)
US3507592A
Cited
US4094602A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-08-08 | 1987-02-07 | 1987-08-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-08-08 | 1991-02-07 | 1991-08-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-08-08 | 1995-02-07 | 1995-08-09 | $7700.00 | Window Closed / Lapsed |