Patent US4569698A successfully refreshed from Google Patents.
US4569698A
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Method of forming isolated device regions by selective successive etching of composite masking layers and semiconductor material prior to ion implantation
Assignee: Raytheon Co
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Filing: 1985-05-31
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Granted: 1986-02-11
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Expires: 2005-05-31
Abstract
Abstract A method for forming isolation regions in a semiconductor structure is provided. A mask comprising an upper and a lower layer of different materials is provided over the surface of the structure. A window is formed in the upper layer over the portions of the structure wherein the isolation regions are to be provided. Using the window in the upper layer as a mask, a larger window is formed in the lower layer by bringing a chemical etchant which etches only the lower layer into contact with the portions of the lower layer exposed by the window in the upper layer. The larger window formed in the lower layer is used as an etching mask to form an isolation groove, or depression, in the underlying semiconductor structure. The upper layer having the smaller window is used as an ion implantation mask for implanting particles into the bottom portion of the groove while masking the side portions of the grooves from the ions. With such method, lateral oxidation regions having self-registered anti-inversion regions which are located under the bottoms of the isolation regions and are spaced from the peripheries of the isolation regions by uniform, predetermined distances are obtained.
Inventors
- 👤 Wolfgang M. Feist
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 05:15
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/10; H10W10/13; H10D; H10D62/00; H10D62/10; H10D62/102; H10D62/112; H10P; H10P50/00; H10P50/69; H10P50/691; H10W10/01; H10W10/011; H10W10/012; H10W10/0121; H10W10/0124; H10W10/0125; H10W10/0126
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
128 words
A method for forming a semiconductor structure comprising the step of: (a) forming a mask comprising upper and lower layers of different materials over a surface of a semiconductor with a first window in the lower layer and a second, smaller, window in the upper layer, edge portions of the second window overhanging edge portions of the first window a length greater than the thickness of the lower layer; (b) forming a depression in the portion of the semiconductor disposed beneath the first window with side wall portions masked by the overhanging edge portions of the second window; and (c) ion implanting particles into a region of the semiconductor disposed beneath the depression exposed by the second window and unmasked by the edge portions of the second window.
Claim 2
Independent Claim
128 words
A method for forming a semiconductor structure comprising the step of: (a) forming a mask comprising upper and lower layers of different materials over a surface of a semiconductor with a first window in the lower layer and a second, smaller, window in the upper layer, edge portions of the second window overhanging edge portions of the first window a length greater than the thickness of the lower layer; (b) forming a depression in the portion of the semiconductor disposed beneath the first window with side wall portions masked by the overhanging edge portions of the second window; and (c) ion implanting particles into a region of the semiconductor disposed beneath the depression exposed by the second window and unmasked by the edge portions of the second window.
Claim 3
Independent Claim
153 words
A method for forming a semiconductor structure comprising the steps of: (a) forming a mask comprising upper and lower layers of different material over a surface of a semiconductor with a first window in such lower layer exposing a portion of the surface of the semiconductor and a smaller, second window in the upper layer having extended peripheral portions masking peripheral portions of the exposed surface portion of the semiconductor, the length of each extended peripheral portion of the upper layer being greater than the thickness of the lower layer; (b) bringing an etchant into contact with the exposed surface portion of the semiconductor forming a depression in such semiconductor with side wall portions masked by the extended peripheral portions of the second window; and (c) ion implanting particles into a region of the semiconductor below the depression exposed by the second window and unmasked by the peripheral portions of the second window.
Claim 4
Independent Claim
153 words
A method for forming a semiconductor structure comprising the steps of: (a) forming a mask comprising upper and lower layers of different material over a surface of a semiconductor with a first window in such lower layer exposing a portion of the surface of the semiconductor and a smaller, second window in the upper layer having extended peripheral portions masking peripheral portions of the exposed surface portion of the semiconductor, the length of each extended peripheral portion of the upper layer being greater than the thickness of the lower layer; (b) bringing an etchant into contact with the exposed surface portion of the semiconductor forming a depression in such semiconductor with side wall portions masked by the extended peripheral portions of the second window; and (c) ion implanting particles into a region of the semiconductor below the depression exposed by the second window and unmasked by the peripheral portions of the second window.
Claim 5
Independent Claim
246 words
A method for forming a semiconductor structure comprising the steps of: (a) forming a first layer of a first material over a surface of a semiconductor; (b) forming a second layer of a second, different material over the first layer; (c) forming a first window in a portion of the second layer and exposing portions of the first layer; (d) bringing a chemical etchant into contact with the exposed edge portions of the first layer to selectively etch the portions of the first layer providing a second window in the first layer larger than the first window, peripheral portions of the second window extending over the first window an amount greater than the thickness of the first layer and wherein the first window exposes a portion of the surface of the semiconductor and with edge portions of the second window overhanging peripheral portions of the exposed portion of the semiconductor; (e) bringing an etchant into contact with the portion of the semiconductor exposed by the second window forming a depression in the semiconductor with side wall portions and a bottom portion, the extended peripheral portions of the first window overhanging such side wall portions to mask such side wall portions; (f) ion implanting particles into a region disposed at the bottom portion of the depression with the extended peripheral portions of the first window masking the side wall portions of such depression preventing ion implantation of such particles into the side wall portions of such depression.
Claim 6
Independent Claim
246 words
A method for forming a semiconductor structure comprising the steps of: (a) forming a first layer of a first material over a surface of a semiconductor; (b) forming a second layer of a second, different material over the first layer; (c) forming a first window in a portion of the second layer and exposing portions of the first layer; (d) bringing a chemical etchant into contact with the exposed edge portions of the first layer to selectively etch the portions of the first layer providing a second window in the first layer larger than the first window, peripheral portions of the second window extending over the first window an amount greater than the thickness of the first layer and wherein the first window exposes a portion of the surface of the semiconductor and with edge portions of the second window overhanging peripheral portions of the exposed portion of the semiconductor; (e) bringing an etchant into contact with the portion of the semiconductor exposed by the second window forming a depression in the semiconductor with side wall portions and a bottom portion, the extended peripheral portions of the first window overhanging such side wall portions to mask such side wall portions; (f) ion implanting particles into a region disposed at the bottom portion of the depression with the extended peripheral portions of the first window masking the side wall portions of such depression preventing ion implantation of such particles into the side wall portions of such depression.
Claim 7
Independent Claim
30 words
The method recited in either one of claims 1, 2 or 3 including the step of forming an insulating material in the formed depression subsequent to the ion implantation step.
Claim 8
Independent Claim
146 words
A method for forming a semiconductor structure comprising the step of: (a) providing a substrate; (b) forming an epitaxial layer of semiconductor material on the substrate; (c) forming a mask comprising upper and lower layers of different materials over a surface of the epitaxial layer with a first window in the lower layer and a second, smaller window in the upper layer, edge portions of the second window overhanging edge portions of the first window a length greater than the thickness of the lower layer; (d) forming a depression in the portion of the epitaxial layer disposed beneath the first window with side wall portions masked by the overhanging edge portions of the second window; and (e) ion implanting particles into a region of the epitaxial layer disposed beneath the depression exposed by the second window and unmasked by the edge portions of the second window.
Claim 9
Independent Claim
146 words
A method for forming a semiconductor structure comprising the step of: (a) providing a substrate; (b) forming an epitaxial layer of semiconductor material on the substrate; (c) forming a mask comprising upper and lower layers of different materials over a surface of the epitaxial layer with a first window in the lower layer and a second, smaller window in the upper layer, edge portions of the second window overhanging edge portions of the first window a length greater than the thickness of the lower layer; (d) forming a depression in the portion of the epitaxial layer disposed beneath the first window with side wall portions masked by the overhanging edge portions of the second window; and (e) ion implanting particles into a region of the epitaxial layer disposed beneath the depression exposed by the second window and unmasked by the edge portions of the second window.
Claim 10
Independent Claim
171 words
A method for forming a semiconductor structure comprising the steps of: (a) providing a substrate; (b) forming an epitaxial layer of semiconductor material on the substrate; (c) forming a mask comprising upper and lower layers of different material over a surface of the epitaxial layer with a first window in such lower layer exposing a portion of the surface of the semiconductor and a smaller, second window in the upper layer having extended peripheral portions masking peripheral portions of the exposed surface portion of the semiconductor, the length of each extended peripheral portion of the upper layer being greater than the thickness of the lower layer; (d) bringing an etchant into contact with the exposed surface portion of the epitaxial layer forming a depression in such semiconductor with side wall portions masked by the extended peripheral portions of the second window; and (e) ion implanting particles into a region of the epitaxial layer below the depression exposed by the second window and unmasked by the peripheral portions of the second window.
Claim 11
Independent Claim
171 words
A method for forming a semiconductor structure comprising the steps of: (a) providing a substrate; (b) forming an epitaxial layer of semiconductor material on the substrate; (c) forming a mask comprising upper and lower layers of different material over a surface of the epitaxial layer with a first window in such lower layer exposing a portion of the surface of the semiconductor and a smaller, second window in the upper layer having extended peripheral portions masking peripheral portions of the exposed surface portion of the semiconductor, the length of each extended peripheral portion of the upper layer being greater than the thickness of the lower layer; (d) bringing an etchant into contact with the exposed surface portion of the epitaxial layer forming a depression in such semiconductor with side wall portions masked by the extended peripheral portions of the second window; and (e) ion implanting particles into a region of the epitaxial layer below the depression exposed by the second window and unmasked by the peripheral portions of the second window.
Claim 12
Independent Claim
271 words
A method for forming a semiconductor structure comprising the steps of: (a) providing a substrate; (b) forming an epitaxial layer of semiconductor material on the substrate; (c) forming a first layer of a first material over a surface of a the epitaxial layer; (d) forming a second layer of a second, different material over the first layer; (e) forming a first window in a portion of the second layer and exposing portions of the first layer; (f) bringing a chemical etchant into contact with the exposed portions of the first layer to selectively etch the portions of the first layer providing a first window in the first layer larger than the second window, peripheral portions of the second window extending over the first window an amount greater than the thickness of the first layer and wherein the second window exposes a portion of the surface of the epitaxial layer and with edge portions of the first window overhanging peripheral portions of the exposed portion of the epitaxial layer; (g) bringing an etchant into contact with the portion of the epitaxial layer exposed by the second window forming a depression in the epitaxial layer with side wall portions and a bottom portion, the extended peripheral portions of the first window overhanging such side wall portions to mask such side wall portions; (h) ion implanting particles into a region disposed at the bottom portion of the depression formed in the epitaxial layer with the extended peripheral portions of the first window masking the side wall portions of such depression preventing ion implantation of such particles into the side wall portions of such depression.
Claim 13
Independent Claim
271 words
A method for forming a semiconductor structure comprising the steps of: (a) providing a substrate; (b) forming an epitaxial layer of semiconductor material on the substrate; (c) forming a first layer of a first material over a surface of a the epitaxial layer; (d) forming a second layer of a second, different material over the first layer; (e) forming a first window in a portion of the second layer and exposing portions of the first layer; (f) bringing a chemical etchant into contact with the exposed portions of the first layer to selectively etch the portions of the first layer providing a first window in the first layer larger than the second window, peripheral portions of the second window extending over the first window an amount greater than the thickness of the first layer and wherein the second window exposes a portion of the surface of the epitaxial layer and with edge portions of the first window overhanging peripheral portions of the exposed portion of the epitaxial layer; (g) bringing an etchant into contact with the portion of the epitaxial layer exposed by the second window forming a depression in the epitaxial layer with side wall portions and a bottom portion, the extended peripheral portions of the first window overhanging such side wall portions to mask such side wall portions; (h) ion implanting particles into a region disposed at the bottom portion of the depression formed in the epitaxial layer with the extended peripheral portions of the first window masking the side wall portions of such depression preventing ion implantation of such particles into the side wall portions of such depression.
Claim 14
Independent Claim
30 words
The method recited in either one of claims 5, 6 or 7 including the step of forming an insulating material in the formed depression subsequent to the ion implantation step.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-02-10 | 1989-08-12 | 1990-02-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-02-10 | 1993-08-12 | 1994-02-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-02-10 | 1997-08-12 | 1998-02-11 | $7700.00 | Window Closed / Lapsed |