Method of making a fast IGFET

Claim 1

A method for making integrated CMOS transistors comprising: (a) growing a layer of silicon dioxide on the surface of a silicon substrate of one conductivity type; (b) forming a first photoresist mask over said silicon dioxide layer, said mask having an aperture registered with the site at which the gate of one FET device is to be formed in said substrate; (c) selectively implanting through said mask aperture and through said silicon dioxide impurity ions of said one conductivity type to adjust the threshold of said one FET device; (d) removing said first mask by a standard dissolution step, and by a standard chemcial vapor deposition step depositing a blanket layer of polycrystalline silicon over said oxide layer; (e) forming a second mask that is patternwise complementary to said first mask to the extent that at the device region of said FET said second mask has a portion selectively covering said one-device gate site and exposing the adjacent source and drain sites; (f) etching away the portions of said polysilicon layer that are exposed through said second mask to form said gate from a portion of said polysilicon layer; (g) doping with impurities of said opposite conductivity type at said source and drain sites to form said source and drain using said gate as a self-aligning mask; and (h) diffusing impurities of said opposite conductivity type in another FET device region prior to growing said silicon dioxide layer to form a well of opposite conductivity type, said first mask having an aperture over the entire of said another FET region so that said selectively implanting to adjust the threshold of one said FET device also effects a blanket implanting of opposite type impurities into said another device region to adjust the threshold of and increase the speed of said another device, said second mask additionally selectively covering the gate site of said another FET device and being open over the adjacent source and drain sites whereby said etching also removes portions of said polysilicon layer adjacent to said another-device-gate site to form said another-gate site to form said another-device gate and doping with impurities of said one conductivity type at said source and drain sites of said another device using said another-device gate as a self-aligning mask.

Claim 2

A method for making integrated CMOS transistors comprising: (a) growing a layer of silicon dioxide on the surface of a silicon substrate of one conductivity type; (b) forming a first photoresist mask over said silicon dioxide layer, said mask having an aperture registered with the site at which the gate of one FET device is to be formed in said substrate; (c) selectively implanting through said mask aperture and through said silicon dioxide impurity ions of said one conductivity type to adjust the threshold of said one FET device; (d) removing said first mask by a standard dissolution step, and by a standard chemcial vapor deposition step depositing a blanket layer of polycrystalline silicon over said oxide layer; (e) forming a second mask that is patternwise complementary to said first mask to the extent that at the device region of said FET said second mask has a portion selectively covering said one-device gate site and exposing the adjacent source and drain sites; (f) etching away the portions of said polysilicon layer that are exposed through said second mask to form said gate from a portion of said polysilicon layer; (g) doping with impurities of said opposite conductivity type at said source and drain sites to form said source and drain using said gate as a self-aligning mask; and (h) diffusing impurities of said opposite conductivity type in another FET device region prior to growing said silicon dioxide layer to form a well of opposite conductivity type, said first mask having an aperture over the entire of said another FET region so that said selectively implanting to adjust the threshold of one said FET device also effects a blanket implanting of opposite type impurities into said another device region to adjust the threshold of and increase the speed of said another device, said second mask additionally selectively covering the gate site of said another FET device and being open over the adjacent source and drain sites whereby said etching also removes portions of said polysilicon layer adjacent to said another-device-gate site to form said another-gate site to form said another-device gate and doping with impurities of said one conductivity type at said source and drain sites of said another device using said another-device gate as a self-aligning mask.

Claim 9

A method for making integrated CMOS transistors comprising: (a) forming at one surface region of a silicon substrate of one conductivity type a well of the other conductivity type; and (b) at a part of said surface region having a one conductivity type in which one CMOS transistor is to be formed, selectively implanting ions of said one type only in the channel region thereof to adjust the threshold of said one transistor, while simultaneously implanting said one conductivity type ions in all of a part of said well in which another and complementary CMOS transistor is to be formed to adjust the threshold of said complementary transistor, so that all of the source/drain to substrate capacitances of said transistors are reduced by said threshold adjusting implantation.

Claim 10

A method for making integrated CMOS transistors comprising: (a) forming at one surface region of a silicon substrate of one conductivity type a well of the other conductivity type; and (b) at a part of said surface region having a one conductivity type in which one CMOS transistor is to be formed, selectively implanting ions of said one type only in the channel region thereof to adjust the threshold of said one transistor, while simultaneously implanting said one conductivity type ions in all of a part of said well in which another and complementary CMOS transistor is to be formed to adjust the threshold of said complementary transistor, so that all of the source/drain to substrate capacitances of said transistors are reduced by said threshold adjusting implantation.