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US4918031A Expired / Lapsed US ⏱️ 0.0 years remaining

Processes depending on plasma generation using a helical resonator

Assignee: Tokyo Electron Ltd
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Filing: 1988-12-28
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Granted: 1990-04-17
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Expires: 2008-12-28
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Abstract

Abstract Anisotropic plasma etching is accomplished utilizing a helical resonator operated at relatively low gas pressure. The use of this combination yields an extremely high flux of ionic species with resulting rapid anisotropic etching. A helical resonator in conjunction with suitable precursors is also quite useful for plasma induced deposition.

Inventors

  • 👤 Daniel L. Flamm
  • 👤 Dale E. Ibbotson
  • 👤 Wayne L. Johnson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 04:19
CPC Classifications
H; H05; H05H; H05H1/00; H05H1/24; H05H1/26; H05H1/30; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32082; H01J37/321; H05H1/46; H01J2237/00; H01J2237/32; H01J2237/33; H01J2237/334; H01J2237/3343; H01J2237/3345; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/949

Claims Analysis

Total Claims: 44
Claim 1
Independent Claim 69 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities that induce anisotropic removal of material from said substrate and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said species is from a discharge in a gas at a pressure less than about 10 mTorr
Claim 2
Dependent Claim 69 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities that induce anisotropic removal of material from said substrate and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said species is from a discharge in a gas at a pressure less than about 10 mTorr
Claim 3
Dependent Claim 12 words
The process of claim 1 wherein said device comprises a semiconductor device.
Claim 4
Dependent Claim 16 words
The process of claim 1 wherein said helical resonator is subjected to an external magnetic field.
Claim 5
Dependent Claim 11 words
The process of claim 1 wherein said helical resonator is pulsed.
Claim 6
Dependent Claim 16 words
The process of claim 4 wherein said pulsing corresponds to an associated change in processing conditions.
Claim 7
Dependent Claim 15 words
The process of claim 5 wherein said change comprises a periodic varying of said gas.
Claim 8
Dependent Claim 15 words
The process of claim 1 wherein more than one of said helical resonators is employed.
Claim 9
Dependent Claim 21 words
The process of claim 1 wherein said resonator comprises a half wave resonator or a multiple of a half wave resonator.
Claim 10
Dependent Claim 17 words
The process of claim 8 wherein said helical resonator is grounded on both ends of the helix.
Claim 11
Dependent Claim 22 words
The process of claim 1 wherein said resonator comprises a quarter wave resonator or an odd multiple of a quarter wave resonator.
Claim 12
Dependent Claim 17 words
The process of claim 10 wherein said helical resonator is grounded on one end of said helix.
Claim 13
Dependent Claim 28 words
The process of claim 1 wherein an electric field, or a magnetic field, is employed to affect the course of said species from said resonator to said substrate.
Claim 14
Dependent Claim 20 words
The process of claim 1 wherein a longitudinally conducting member having relatively low conduction circumferentially is present in said resonator.
Claim 15
Dependent Claim 60 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition of entities and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said species is from a discharge in a gas at a pressure less than about 10 mTorr.
Claim 16
Dependent Claim 60 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition of entities and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said species is from a discharge in a gas at a pressure less than about 10 mTorr.
Claim 17
Dependent Claim 12 words
The process of claim 14 wherein said device comprises a semiconductor device.
Claim 18
Dependent Claim 15 words
The process of claim 14 wherein said helical resonator is subjected to an external field.
Claim 19
Dependent Claim 11 words
The process of claim 14 wherein said helical resonator is pulsed.
Claim 20
Dependent Claim 16 words
The process of claim 17 wherein said pulsing corresponds to an associated change in processing conditions.
Claim 21
Dependent Claim 15 words
The process of claim 18 wherein said change comprises a periodic varying of said gas.
Claim 22
Dependent Claim 21 words
The process of claim 14 wherein said resonator comprises a half wave resonator or a multiple of a half wave resonator.
Claim 23
Dependent Claim 17 words
The process of claim 20 wherein said helical resonator is grounded on both ends of the helix.
Claim 24
Dependent Claim 23 words
The process of claim 14 wherein said helical resonator is a quarter wave resonator or an odd multiple of a quarter wave resonator.
Claim 25
Dependent Claim 17 words
The process of claim 22 wherein said helical resonator is grounded on one end of said helix.
Claim 26
Dependent Claim 36 words
The process of claim 14 wherein an electric field, or a magnetic field, is employed to affect said species at said substrate or to affect the course of said species from said resonator to said substrate.
Claim 27
Dependent Claim 55 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities that induce deposition on said substrate and employ the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said substrate is within said resonator.
Claim 28
Dependent Claim 55 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities that induce deposition on said substrate and employ the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said substrate is within said resonator.
Claim 29
Dependent Claim 11 words
The process of claim 25 wherein said helical resonator is pulsed.
Claim 30
Dependent Claim 16 words
The process of claim 26 wherein said pulsing corresponds to an associated change in processing conditions.
Claim 31
Dependent Claim 18 words
The process of claim 27 wherein said change comprises a periodic varying of the composition of said gas.
Claim 32
Dependent Claim 20 words
The process of claim 25 wherein a longitudinally conducting member having relatively low conduction circumferentially is present in said resonator.
Claim 33
Dependent Claim 13 words
The process of claim 25 wherein a bias is applied to said substrates.
Claim 34
Dependent Claim 58 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said resonator comprises a half wave, multiple half wave, or odd multiple quarter wave resonator.
Claim 35
Dependent Claim 58 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator wherein said resonator comprises a half wave, multiple half wave, or odd multiple quarter wave resonator.
Claim 36
Dependent Claim 13 words
The process of claim 31 wherein said species is implanted in said substrate.
Claim 37
Dependent Claim 17 words
The process of claim 31 wherein said species interacts with a second species to form said entity.
Claim 38
Dependent Claim 15 words
The process of claim 33 wherein said second species is introduced downstream from said resonator.
Claim 39
Dependent Claim 14 words
The process of claim 31 wherein an electrical bias is applied to said substrates.
Claim 40
Dependent Claim 20 words
The process of claim 31 wherein a longitudinally conducting member having relatively low conduction circumferentially is present in said resonator.
Claim 41
Dependent Claim 53 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator and said species interacts downstream with a second gas phase species.
Claim 42
Dependent Claim 53 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities and employing the resulting substrate for completion of said device, characterized in that said entity emanates from a species generated in a helical resonator and said species interacts downstream with a second gas phase species.
Claim 43
Dependent Claim 50 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities and employing the resulting substrate for completion of said device characterized in that said entity is at least in part generated due to a pulsing process in association with a helical resonator.
Claim 44
Dependent Claim 50 words
A process for fabricating a device comprising the steps of subjecting a substrate to a composition comprising entities and employing the resulting substrate for completion of said device characterized in that said entity is at least in part generated due to a pulsing process in association with a helical resonator.

References Cited (Backward Citations)

US4123663A Cited
US4233109A Cited
US4175235A Cited
US4160690A Cited
US4298443A Cited
US4368092A Cited
EP0100079A2 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-04-16 1993-10-16 1994-04-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-04-16 1997-10-16 1998-04-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-04-16 2001-10-16 2002-04-17 $7700.00 Window Closed / Lapsed

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