Patent US5000827A successfully refreshed from Google Patents.
US5000827A
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US
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Method and apparatus for adjusting plating solution flow characteristics at substrate cathode periphery to minimize edge effect
Assignee: Semiconductor Components Industries LLC
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Filing: 1990-01-02
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Granted: 1991-03-19
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Expires: 2010-01-02
Abstract
Abstract A method and apparatus for electroplating metallized bumps of substantially uniform height on predetermined terminal areas of a substrate. Cup plating apparatus includes elements for adjusting parameters affecting the geometry of the substrate relative to the plating cup, as well as flow rate of the electroplating solution against the substrate surface. By achieving non-laminar flow of the electroplating solution near the substrate edges, the plating characteristics of the electroplating solution are altered in this region, substantialy offsetting "edge effect", so that the resulting plated bump height is substantially uniform across the substrate.
Inventors
- 👤 Virgil E. Schuster
- 👤 Reginald K. Asher, Sr.
- 👤 Bhagubhai D. Patel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 21:31
CPC Classifications
C; C25; C25D; C25D5/00; C25D5/02; C25D5/08; H; H05; H05K; H05K3/00; H05K3/22; H05K3/24; H05K3/241
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
221 words
A method of forming metallized bumps on predetermined terminal areas of a planar substrate, said bumps being of substantially uniform height across said substrate, wherein said method comprises: (a) providing a planar substrate having thereon a multiplicity of terminal areas; (b) applying an electrical potential having a first electrical polarity to said terminal areas; (c) applying an electrical potential having a second electrical polarity to an electrical terminal immersed in a container of an electroplating solution; (d) exposing said substrate to said electroplating solution to permit the growth of said metallization bumps on said terminal areas; (e) controlling the growth of said metallization bumps in a predetermined region of said substrate by altering the metallic ion concentration of said electroplating solution in said predetermined region; (f) providing said container with an opening whose shape approximates that of said substrate; (g) positioning said substrate proximate to said container opening; (h) providing an inlet within said container for pumping said solution into said container, said solution exiting said container through said opening; wherein said metallic ion concentration of said electroplating solution is changed by: (i) in step (f) altering the size of said opening; (j) in step (g) altering the distance of said substrate from said container opening; and (k) in step (h) altering the flow rate of said solution through said opening.
Claim 2
Independent Claim
221 words
A method of forming metallized bumps on predetermined terminal areas of a planar substrate, said bumps being of substantially uniform height across said substrate, wherein said method comprises: (a) providing a planar substrate having thereon a multiplicity of terminal areas; (b) applying an electrical potential having a first electrical polarity to said terminal areas; (c) applying an electrical potential having a second electrical polarity to an electrical terminal immersed in a container of an electroplating solution; (d) exposing said substrate to said electroplating solution to permit the growth of said metallization bumps on said terminal areas; (e) controlling the growth of said metallization bumps in a predetermined region of said substrate by altering the metallic ion concentration of said electroplating solution in said predetermined region; (f) providing said container with an opening whose shape approximates that of said substrate; (g) positioning said substrate proximate to said container opening; (h) providing an inlet within said container for pumping said solution into said container, said solution exiting said container through said opening; wherein said metallic ion concentration of said electroplating solution is changed by: (i) in step (f) altering the size of said opening; (j) in step (g) altering the distance of said substrate from said container opening; and (k) in step (h) altering the flow rate of said solution through said opening.
Claim 3
Dependent Claim
22 words
The method of according to claim 1, wherein said metallization bumps comprise metal selected from the group consisting of silver and tin.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-03-18 | 1994-09-17 | 1995-03-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-03-18 | 1998-09-17 | 1999-03-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-03-18 | 2002-09-17 | 2003-03-19 | $7700.00 | Window Closed / Lapsed |