Abstract A method of producing a semiconductor device including processes of forming an optically transparent film on a semiconductor substrate having an alignment mark, and thereafter forming an optically opaque film, includes the step of selectively etching said transparent film to remove at least a part thereof disposed above said alignment mark, and thereafter forming said optically opaque film on said semiconductor substrate. A method of producing a semiconductor device including a step of making a measurement mark formed on a semiconductor substrate for measuring relative error amount caused during alignment inlcudes the steps of forming an optically transparent film on said semiconductor substrate provisionally formed with an aligning pattern of said measurement mark, thereafter selectively etching said transparent film to remove a region thereof above said aligning pattern of said measurement mark and to remove another region thereof for a later formed to-be-aligned pattern, thereafter forming an optically opaque film on said semiconductor substrate, and then coating a photo-sensitive film and carrying out exposue and development so as to form a remaining to-be-aligned pattern of said measurement mark.
A method of producing a semiconductor device including processes of forming an optically transparent film on a semiconductor substrate having an alignment mark, and thereafter forming an optically opaque film, the method comprising the steps of: selectively etching said transparent film to remove at least a part thereof disposed above said alignment mark; and thereafter forming said optically opaque film on said semiconductor substrate.
Claim 2
Independent Claim
64 words
A method of producing a semiconductor device including processes of forming an optically transparent film on a semiconductor substrate having an alignment mark, and thereafter forming an optically opaque film, the method comprising the steps of: selectively etching said transparent film to remove at least a part thereof disposed above said alignment mark; and thereafter forming said optically opaque film on said semiconductor substrate.
Claim 3
Dependent Claim
39 words
A method as claimed in claim 1; including the steps of, after forming said optically opaque film, coating a photosensitive organic film, and carrying out positioning and exposure with using said alignment mark by means of an exposure instrument.
Claim 4
Independent Claim
118 words
A method of producing a semiconductor device including a step of making a measurement mark formed on a semiconductor substrate for measuring relative error amount caused during alignment, the method comprising the steps of: forming an optically transparent film on said semiconductor substrate provisionally formed with an aligning pattern of said measurement mark; thereafter selectively etching said transparent film to remove a region thereof above said aligning pattern of said measurement mark and to remove another region thereof for a later formed to-be-aligned pattern; thereafter forming an optically opaque film on said semiconductor substrate; and then coating a photo-sensitive film and carrying out exposure and development so as to form a remaining to-be-aligned pattern of said measurement mark.
Claim 5
Independent Claim
118 words
A method of producing a semiconductor device including a step of making a measurement mark formed on a semiconductor substrate for measuring relative error amount caused during alignment, the method comprising the steps of: forming an optically transparent film on said semiconductor substrate provisionally formed with an aligning pattern of said measurement mark; thereafter selectively etching said transparent film to remove a region thereof above said aligning pattern of said measurement mark and to remove another region thereof for a later formed to-be-aligned pattern; thereafter forming an optically opaque film on said semiconductor substrate; and then coating a photo-sensitive film and carrying out exposure and development so as to form a remaining to-be-aligned pattern of said measurement mark.
Claim 6
Dependent Claim
33 words
A method as claimed in claim 3 including the step of: measuring the relative error amount caused during alignment with using said measurement mark so as to determine whether said alignment is acceptable.