Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
384 words
A method of forming a multichip module substrate comprising the steps of: selecting a planar platform having opposed mutually parallel surfaces; forming first via sites on a first of said surfaces of said platform; plating in said via sites to form first vias in said via sites to define a first subassembly; laminating a first sheet of filled fluoropolymeric composite material onto said first subassembly to define a laminated first subassembly; planarizing said laminated first subassembly to expose selected ones of said first vias and to define a first planarized surface; depositing a first thin metallized seed layer on said first planarized surface; forming "y" circuit line sites and second via sites on said first seed layer; plating "y" circuit lines and second vias in said "y" circuit line sites and said second via sites, respectively; selectively flash etching said first seed layer to define a second subassembly; laminating a second sheet of filled fluoropolymeric composite material onto said second subassembly; planarizing said laminated second subassembly to expose selected ones of said second vias and define a second planarized surface; depositing a second thin metallized seed layer on said second planarized surface; forming "x" circuit line sites and third via sites on said second seed layer; plating "x" circuit lines and third vias in said "x" circuit line sites and said third via sites, respectively; selectively flash etching said second seed layer to define a third subassembly; laminating a third sheet of filled fluoropolymeric composite material onto said third subassembly; planarizing said laminated third subassembly to expose selected ones of said third vias and define a third planarized surface; depositing a third thin metallized seed layer on said third planarized surface; forming voltage plane sites and fourth via sites on said third seed layer; plating a voltage plane on said third seed layer and plating fourth vias in said fourth via sites; selectively flash etching said third seed layer to define a fourth subassembly; providing a cover layer on said fourth subassembly; planarizing said covered fourth subassembly to expose selected ones of said fourth vias on a fourth planarized surface; depositing a fourth thin metallized seed layer on said fourth planarized surface; forming pad sites on said fourth seed layer; plating pads in said pad sites; and selectively flash etching said fourth seed layer.
Claim 2
Independent Claim
384 words
A method of forming a multichip module substrate comprising the steps of: selecting a planar platform having opposed mutually parallel surfaces; forming first via sites on a first of said surfaces of said platform; plating in said via sites to form first vias in said via sites to define a first subassembly; laminating a first sheet of filled fluoropolymeric composite material onto said first subassembly to define a laminated first subassembly; planarizing said laminated first subassembly to expose selected ones of said first vias and to define a first planarized surface; depositing a first thin metallized seed layer on said first planarized surface; forming "y" circuit line sites and second via sites on said first seed layer; plating "y" circuit lines and second vias in said "y" circuit line sites and said second via sites, respectively; selectively flash etching said first seed layer to define a second subassembly; laminating a second sheet of filled fluoropolymeric composite material onto said second subassembly; planarizing said laminated second subassembly to expose selected ones of said second vias and define a second planarized surface; depositing a second thin metallized seed layer on said second planarized surface; forming "x" circuit line sites and third via sites on said second seed layer; plating "x" circuit lines and third vias in said "x" circuit line sites and said third via sites, respectively; selectively flash etching said second seed layer to define a third subassembly; laminating a third sheet of filled fluoropolymeric composite material onto said third subassembly; planarizing said laminated third subassembly to expose selected ones of said third vias and define a third planarized surface; depositing a third thin metallized seed layer on said third planarized surface; forming voltage plane sites and fourth via sites on said third seed layer; plating a voltage plane on said third seed layer and plating fourth vias in said fourth via sites; selectively flash etching said third seed layer to define a fourth subassembly; providing a cover layer on said fourth subassembly; planarizing said covered fourth subassembly to expose selected ones of said fourth vias on a fourth planarized surface; depositing a fourth thin metallized seed layer on said fourth planarized surface; forming pad sites on said fourth seed layer; plating pads in said pad sites; and selectively flash etching said fourth seed layer.
Claim 3
Dependent Claim
13 words
The method of claim 1 wherein: said planar platform defines a ground plane.
Claim 4
Dependent Claim
53 words
The method of claim 1 wherein said steps of forming said first, second, third and fourth via sites and said steps of forming said "x" and "y" circuit line sites include the steps of: selectively depositing photoresist material; imaging said deposited photoresist material; and developing said imaged photoresist material to define said sites.
Claim 5
Dependent Claim
23 words
The method of claim 3 including the step of: removing any undeveloped photoresist material between the plating steps and the flash etching steps.
Claim 6
Dependent Claim
39 words
The method of claim 3 wherein said steps of plating said first, second, third and fourth vias includes the step of: controlling the height of the vias to be equal to or less than the height of the photoresist.
Claim 7
Dependent Claim
25 words
The method of claim 1 wherein each of said sheets of filled fluoropolymeric composite material includes a thin release layer on a top surface thereof.
Claim 8
Dependent Claim
17 words
The method of claim 1 wherein said filled fluoropolymeric composite material comprises: silane coated, silica filled polytetrafluoroethylene.
Claim 9
Dependent Claim
90 words
The method of claim 1 wherein said laminating steps comprise: (a) at a low pressure, ramping of the laminating temperature up to about 700° F.; (b) increasing the pressure to 500 to 1700 p.s.i.; (c) soaking at about 700° F. and 500 to 1700 p.s.i.; (d) reducing the temperature to about 400° F. while maintaining a pressure of 500 to 1700 p.s.i.; (e) reducing the pressure to about 100 p.s.i. while maintaining the temperature of 400° F.; (f) cooling to below 100° F. at a pressure of about 100 p.s.i.
Claim 10
Dependent Claim
14 words
The method of claim 1 wherein said steps of planarizing comprise: a flycutting process.
Claim 11
Dependent Claim
20 words
The method of claim 9 wherein: said flycutting process utilizes a diamond cutting tool operated at a positive rake angle.
Claim 12
Dependent Claim
13 words
The method of claim 8 wherein: said positive rake angle is about 4°.
Claim 13
Dependent Claim
19 words
The method of claim 1 wherein said steps of depositing seed layers comprise: sputter coating in an argon gas.
Claim 14
Dependent Claim
18 words
The method of claim 1 wherein said cover layer comprises: a fourth sheet of filled fluoropolymeric composite material.
Claim 15
Dependent Claim
15 words
The method of claim 1 wherein said cover layer comprises: a filled cyanate ester resin.
Claim 16
Dependent Claim
13 words
The method of claim 1 wherein said pads comprise: nickel/gold or solder plating.
Claim 17
Dependent Claim
12 words
The method of claim 1 wherein: said vias define solid copper plugs.
Claim 18
Dependent Claim
15 words
The method of claim 1 wherein: at least some of said vias define blind vias.
Claim 19
Dependent Claim
23 words
The method of claim 1 wherein: at least some of said fourth vias extend through, but are electrically isolated from said voltage plane.
Claim 20
Dependent Claim
20 words
The method of claim 1 wherein: selected first and second vias are vertically aligned and are electrically and mechanically connected.
Claim 21
Dependent Claim
21 words
The method of claim 1 wherein: selected first, second and third vias are vertically aligned and are electrically and mechanically connected.
Claim 22
Dependent Claim
22 words
The method of claim 1 wherein: selected first, second, third and fourth vias are vertically aligned and are electrically and mechanically connected.