Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
83 words
A process for pretreating a vacuum deposition chamber having internal aluminum-bearing surfaces after a prior cleaning step which comprises the steps of: a) forming a first tungsten silicide deposit on said aluminum-bearing surfaces in the chamber by flowing into the chamber gases comprising a gaseous source of tungsten and a silane gas; and b) then forming a second tungsten silicide deposit over said first tungsten silicide deposit by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas.
Claim 2
Dependent Claim
83 words
A process for pretreating a vacuum deposition chamber having internal aluminum-bearing surfaces after a prior cleaning step which comprises the steps of: a) forming a first tungsten silicide deposit on said aluminum-bearing surfaces in the chamber by flowing into the chamber gases comprising a gaseous source of tungsten and a silane gas; and b) then forming a second tungsten silicide deposit over said first tungsten silicide deposit by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas.
Claim 3
Dependent Claim
31 words
The process of claim 1 wherein said first deposit of tungsten silicide is carried out until a thickness of at least about 200 Angstroms has been formed over said aluminum-bearing surfaces.
Claim 4
Dependent Claim
31 words
The process of claim 1 wherein said first deposit of tungsten silicide is carried out until a thickness of at least about 800 Angstroms has been formed over said aluminum-bearing surfaces.
Claim 5
Dependent Claim
15 words
The process of claim 1 wherein said gaseous source of tungsten comprises WF 6 .
Claim 6
Dependent Claim
31 words
The process of claim 1 wherein said second deposit of tungsten silicide is carried out until a thickness of at least about 800 Angstroms has been formed over said aluminum-bearing surfaces.
Claim 7
Dependent Claim
31 words
The process of claim 1 wherein said first deposit of tungsten silicide is carried out until a thickness of at least about 1000 Angstroms has been formed over said aluminum-bearing surfaces.
Claim 8
Dependent Claim
19 words
The process of claim 1 wherein said chlorosilane gas comprises dichlorosilane having the formula SiH 2 Cl 2 .
Claim 9
Dependent Claim
34 words
The process of claim 1 wherein said step of forming said first tungsten silicide deposit further comprises flowing a carrier gas into said chamber with said gaseous source of tungsten and said silane gas.
Claim 10
Dependent Claim
37 words
The process of claim 1 wherein said step of forming said first tungsten silicide deposit further comprises maintaining a plasma in said chamber while flowing said gaseous source of tungsten and said silane gas into said chamber.
Claim 11
Dependent Claim
34 words
The process of claim 1 wherein said step of forming said second tungsten silicide deposit further comprises flowing a carrier gas into said chamber with said gaseous source of tungsten and said chlorosilane gas.
Claim 12
Dependent Claim
37 words
The process of claim 1 wherein said step of forming said second tungsten silicide deposit further comprises maintaining a plasma in said chamber while flowing said gaseous source of tungsten and said chlorosilane gas into said chamber.
Claim 13
Dependent Claim
51 words
The process of claim 1 wherein said step of forming said second tungsten silicide deposit over said first tungsten silicide deposit further comprises flowing into said chamber a chlorosilane gas selected from the group consisting of dichlorosilane (SiH 2 Cl 2 ), monochlorosilane (SiH 3 Cl), and trichlorosilane (SiHCl 3 ).
Claim 14
Dependent Claim
129 words
A process for pretreating a vacuum deposition chamber having internal aluminum-bearing surfaces, and a susceptor therein, after a prior cleaning step which comprises the steps of: a) forming a first CVD tungsten silicide deposit, having a thickness of at least about 200 Angstroms, on said aluminum-bearing surfaces in the chamber by flowing into the chamber gases comprising WF 6 gas, silane gas, and a carrier gas; and b) then forming a second CVD tungsten silicide deposit, having a thickness of at least about 800 Angstroms, over said first tungsten silicide deposit by flowing into said chamber gases comprising WF 6 gas, a carrier gas, and a chlorosilane gas selected from the group consisting of dichlorosilane (SiH 2 Cl 2 ), monochlorosilane (SiH 3 Cl), and trichlorosilane (SiHCl 3 ).
Claim 15
Dependent Claim
129 words
A process for pretreating a vacuum deposition chamber having internal aluminum-bearing surfaces, and a susceptor therein, after a prior cleaning step which comprises the steps of: a) forming a first CVD tungsten silicide deposit, having a thickness of at least about 200 Angstroms, on said aluminum-bearing surfaces in the chamber by flowing into the chamber gases comprising WF 6 gas, silane gas, and a carrier gas; and b) then forming a second CVD tungsten silicide deposit, having a thickness of at least about 800 Angstroms, over said first tungsten silicide deposit by flowing into said chamber gases comprising WF 6 gas, a carrier gas, and a chlorosilane gas selected from the group consisting of dichlorosilane (SiH 2 Cl 2 ), monochlorosilane (SiH 3 Cl), and trichlorosilane (SiHCl 3 ).
Claim 16
Dependent Claim
32 words
The process of claim 13 wherein said step of forming said first tungsten silicide deposit further comprises maintaining a susceptor temperature of at least about 300° C. during said first deposition step.
Claim 17
Dependent Claim
37 words
The process of claim 13 wherein said step of forming said first tungsten silicide deposit further comprises maintaining said chamber at a pressure of from about 0.1 Torr to about 2 Torr during said first deposition step.
Claim 18
Dependent Claim
64 words
The process of claim 13 wherein said step of forming said first tungsten silicide deposit further comprises flowing into said chamber: a) from about 1 to about 10 standard cubic centimeters per minute (sccm) of said WF 6 gas; b) from about 10 to about 100 sccm of said silane gas; and c) from about 200 to about 1000 sccm of said carrier gas.
Claim 19
Dependent Claim
38 words
The process of claim 13 wherein said step of forming said second tungsten silicide deposit over said first tungsten silicide deposit further comprises: maintaining a susceptor temperature of at least about 500° C. during said second deposition step.
Claim 20
Dependent Claim
37 words
The process of claim 13 wherein said step of forming said second tungsten silicide deposit further comprises maintaining said chamber at a pressure of from about 0.5 Torr to about 10 Torr during said second deposition step.
Claim 21
Dependent Claim
64 words
The process of claim 13 wherein said step of forming said second tungsten silicide deposit further comprises flowing into said chamber: a) from about 2 to about 10 standard cubic centimeters per minute (sccm) of said WF 6 gas; b) from about 50 to about 400 sccm of said chlorosilane gas; and c) from about 200 to about 1000 sccm of said carrier gas.
Claim 22
Dependent Claim
121 words
A process for depositing tungsten silicide on substrates in a vacuum deposition chamber after a prior cleaning step and wherein the chamber has internal aluminum-bearing surfaces, comprising the steps of: a) forming a first tungsten silicide deposit on said internal aluminum-bearing chamber surfaces in the absence of said substrates by flowing into the chamber gases comprising a gaseous source of tungsten and silane gas; b) then forming a second tungsten silicide deposit over said first tungsten silicide deposit by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas; and c) then forming a tungsten silicide deposit on said substrates by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas.
Claim 23
Dependent Claim
121 words
A process for depositing tungsten silicide on substrates in a vacuum deposition chamber after a prior cleaning step and wherein the chamber has internal aluminum-bearing surfaces, comprising the steps of: a) forming a first tungsten silicide deposit on said internal aluminum-bearing chamber surfaces in the absence of said substrates by flowing into the chamber gases comprising a gaseous source of tungsten and silane gas; b) then forming a second tungsten silicide deposit over said first tungsten silicide deposit by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas; and c) then forming a tungsten silicide deposit on said substrates by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas.
Claim 24
Dependent Claim
26 words
The process of claim 20, in which said second tungsten silicide deposit over said first tungsten silicide deposit is formed in the absence of said substrate.
Claim 25
Dependent Claim
94 words
A process for depositing tungsten silicide on substrates within a vacuum deposition chamber having internal aluminum-bearing surfaces after a prior cleaning step, comprising the step of: a) forming a first tungsten silicide deposit on the aluminum-bearing surfaces in the chamber by flowing into the chamber gases comprising a gaseous source of tungsten and silane gas; and b) then flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas to form a second tungsten silicide deposit over said first tungsten silicide deposit, and the tungsten silicide deposit on said substrates.
Claim 26
Dependent Claim
94 words
A process for depositing tungsten silicide on substrates within a vacuum deposition chamber having internal aluminum-bearing surfaces after a prior cleaning step, comprising the step of: a) forming a first tungsten silicide deposit on the aluminum-bearing surfaces in the chamber by flowing into the chamber gases comprising a gaseous source of tungsten and silane gas; and b) then flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas to form a second tungsten silicide deposit over said first tungsten silicide deposit, and the tungsten silicide deposit on said substrates.
Claim 27
Dependent Claim
146 words
A process for depositing tungsten silicide upon a substrate contained in a vacuum chamber, comprising the steps of: a) cleaning the chamber by flowing a cleaning gas into said chamber to clean deposits of tungsten silicide from the chamber walls and other internal chamber surfaces; b) pretreating said vacuum chamber by: i) forming a first tungsten silicide deposit on aluminum-bearing surfaces within the chamber by flowing into the chamber gases comprising a gaseous source of tungsten and silane gas, and ii) then forming a second tungsten silicide deposit over said first tungsten silicide deposit by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas; and c) then loading one or more substrates into said chamber; and d) flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas to deposit the tungsten silicide on said substrates.
Claim 28
Dependent Claim
146 words
A process for depositing tungsten silicide upon a substrate contained in a vacuum chamber, comprising the steps of: a) cleaning the chamber by flowing a cleaning gas into said chamber to clean deposits of tungsten silicide from the chamber walls and other internal chamber surfaces; b) pretreating said vacuum chamber by: i) forming a first tungsten silicide deposit on aluminum-bearing surfaces within the chamber by flowing into the chamber gases comprising a gaseous source of tungsten and silane gas, and ii) then forming a second tungsten silicide deposit over said first tungsten silicide deposit by flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas; and c) then loading one or more substrates into said chamber; and d) flowing into said chamber gases comprising a gaseous source of tungsten and a chlorosilane gas to deposit the tungsten silicide on said substrates.
Claim 29
Dependent Claim
16 words
The process of claim 23, in which a fluorine-bearing gas is utilized to clean the chamber.
Claim 30
Dependent Claim
25 words
The process of claim 23, in which a plasma is maintained within said chamber during any or all of said cleaning, pretreating, and flowing steps.