Method and apparatus for testing multi-port memory using shadow read

Claim 3

A method of testing a multi-port memory as defined in claim 1, said read operation of said test comprising reading a value in a cell and comparing said value with a predetermined value and said shadow read operation comprising merely reading a value in a cell.

Claim 4

A method of testing a multi-port memory as defined in claim 1, said another cell being a cell in the same column as said cell being tested.

Claim 5

A method of testing a multi-port memory as defined in claim 1, said testing each said cell further including performing said single-port test write operation from a read-write port or a write-only port when said active port is a read-only port.

Claim 6

A method of testing a multi-port memory as defined in claim 1, said testing each said cell further including performing said single-port test read operation from a read-write port or a read-only port when said active port is a write-only port.

Claim 7

A method of testing a multi-port memory as defined in claim 1, said cells being arranged in rows and columns, said concurrently performing a shadow read operation including shadow reading a cell in a column containing said cell being tested.

Claim 8

A method of testing a multi-port memory as defined in claim 1, said cells being arranged in rows and columns, said concurrently performing a shadow read operation including shadow reading an adjacent cell in a column containing said cell being tested.

Claim 9

A method of testing a multi-port memory as defined in claim 2, said cells being arranged in rows and columns, said concurrently performing a shadow read operation including shadow reading a cell in said column containing said cell being tested.

Claim 10

A method of testing a multi-port memory as defined in claim 2, said cells being arranged in rows and columns, said concurrently performing a shadow read operation including shadow reading a cell adjacent said cell being tested and disposed in a column containing said cell being tested.

Claim 11

A method of testing a multi-port memory as defined in claim 1, each said port being a read-write port.

Claim 14

A method of testing a multi-port memory as defined in claim 11, said shadow reading including the step of generating an address for said another cell by inverting a bit of the row address of the cell being tested and performing said shadow read on the cell at the address generated by said generating.

Claim 15

A method of testing a multi-port memory as defined in claim 12, said generating an address for said another cell further including inverting the least significant bit of the row address of said cell being tested.

Claim 16

A method of testing a multi-port memory as defined in claim 1, said one port being an active port and other ports being inactive ports, said test providing a test address identifying the location of a cell to be tested, said method further including: a) applying said test address to an active write-only port or an active read-write port; b) generating a modified test address and applying said modified test address to inactive read-only ports and inactive read-ports so that said inactive ports read from a memory location in the same column as, but a different row from, the memory location specified by said test address; c) applying said test address to an active read-only port or an active read-write port with a read port active during the read operations of said test and applying a modified test address to said ports when their respective read ports are inactive so as to read from a memory location located in the same column but different row than the memory location specified by said test address.

Claim 17

A method of testing a multi-port memory as defined in claim 1, each port of said memory being responsive to a plurality of control signals including a SELECT signal having active and inactive values, a ROW ADDRESS SELECT signal, a COLUMN ADDRESS SELECT signal, a WRITE ENABLE signal and a READ ENABLE signal, and an OUTPUT ENABLE signal, said control signals being ignored when said SELECT signal is inactive, said ROW ADDRESS SELECT and said COLUMN ADDRESS SELECT signals being operable to enable row and column decoder, respectively, of a dynamic RAM, said method further including, for each port: a) selecting all read-write ports and read-only ports of said memory during testing of any of said ports by applying the active value of said SELECT signal, said ROW ADDRESS SELECT and SAID COLUMN ADDRESS SELECT signal associated with the active port and deselecting a write-only port by applying the inactive value of said SELECT signal of said write-only port unless said write-only port is the active write port; b) enabling write operations on the write component of an active read-write port or of a write-only port by applying the active value of said WRITE ENABLE signal associated to this port; c) when said READ ENABLE signal is enabled; i) enabling the read component of an active Read-Write port to read during a read operation of said test and disabling said read component during write operations of said test; or ii) enabling the read component of an active Read-Write port or an active Read-Only port to read according to the test and enabling the read component to perform a shadow read when said ports are inactive; and enabling all other read-write or read-only ports to continuously perform shadow reads; and d) enabling said OUTPUT ENABLE signal for an active read-write port and for all read-only ports and, if there is more than one read-only port, testing for word line shorts between word lines of said read-only ports.

Claim 20

An apparatus for testing a multi-port memory as defined in claim 16, further including; means for making one of said ports as an active port for applying said testing to said active port and for making all other ports inactive ports; means for delivering a test address to each said port; said circuitry for performing a shadow read operation including means for modifying said test address for inactive ports.

Claim 21

An apparatus for testing a multi-port memory as defined in claim 17, said memory being arranged in rows and columns, said means for modifying said test address being operable to modify a bit of the row address of said test address.

Claim 22

An apparatus for testing a multi-port memory as defined in claim 17, said means for modifying said test address being operable to invert the least significant bit of the row address of said test address.

Claim 25

An apparatus for testing a multi-port memory as defined in claim 20, said address modifier including an exclusive-OR gate responsive to a shadow read control signal for inverting a row address bit of a test address.