Programmable integrated circuit having test antifuse circuitry for testing programming conductors

Claim 1

A programmable integrated circuit, comprising: a plurality of linearly extending wire segments, the wire segments being substantially collinearly disposed with respect to one another in a first dimension; a plurality of antifuses, a respective one of the antifuses being disposed between each respective pair of adjacent wire segments; a programming driver; a test transistor; a programming control conductor extending in the first dimension; a plurality of programming transistors, each respective one of the programming transistors having a first electrode coupled to a corresponding respective one of the wire segments and a gate electrode coupled to the programming control conductor; a programming conductor extending in a second dimension perpendicular to the first dimension from the programming driver, to a second electrode of one of the programming transistors, and terminating at the test transistor; a first test conductor extending in the first dimension and being coupled to a gate electrode of test transistor; a second test conductor extending in the first dimension; and a test antifuse disposed electrically in series with the test transistor such that when the test transistor is conductive and the test antifuse is programmed, a conductive path exists through the test transistor, through the programmed test antifuse, and to the second test conductor.