Patent US6703190B2 successfully refreshed from Google Patents.
← Back to Patent Explorer
US6703190B2 Expired / Lapsed US ⏱️ 0.0 years remaining

Method for producing resist structures

Assignee: Polaris Innovations Ltd
•
Filing: 2002-06-07
•
Granted: 2004-03-09
•
Expires: 2022-06-07
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method for creating negative resist structures is described. In the method, a chemically fortified resist is applied to a substrate, dried, irradiated with light, x-ray, electron or ion beams, heated, developed using a aqueous-alkaline developer solution and siliconized from a liquid phase. The resist contains the following constituent: a polymer, whose polarity is modified by acidic action and which contains carboxylic acid anhydride groups, preferably in latent form; a compound which releases an acid as a result of thermal treatment; a photoreactive compound, from which a base is created during the irradiation with light, x-ray, electron or ion beams; a solvent; and optionally one or more additives.

Inventors

  • 👤 Klaus Elian
  • 👤 Stefan Hien
  • 👤 Ernst-christian Richter
  • 👤 Michael Sebald

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 22:03
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/0045; G03F7/039; G03F7/075; G03F7/0757; G03F7/0758; G03F7/26; G03F7/40; G03F7/405; Y; Y10; Y10S; Y10S430/00; Y10S430/1053; Y10S430/1055; Y10S430/106; Y10S430/111; Y10S430/114; Y10S430/122; Y10S430/124; Y10S430/127

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 138 words
A process for producing negative resist structures, which comprises the steps of: providing a substrate; applying a chemical amplification resist to the substrate, the chemical amplification resist containing: a polymer which changes polarity when exposed to an acid, and the polymer including carboxylic anhydride groups; a compound functioning as a thermoacid generator from which an acid is released when exposed to a thermal treatment; a photoreactive compound functioning as a photobase generator from which a base is formed upon exposure to one of light, X-rays, electron beams and ion beams; and a solvent; drying the chemical amplification resist; exposing the chemical amplification resist to one of light, X-rays, electron beams and ion beams; heating the chemical amplification resist; developing the chemical amplification resist with an aqueous-alkaline developer solution; and siliconizing the chemical amplification resist from a liquid phase.
Claim 2
Dependent Claim 138 words
A process for producing negative resist structures, which comprises the steps of: providing a substrate; applying a chemical amplification resist to the substrate, the chemical amplification resist containing: a polymer which changes polarity when exposed to an acid, and the polymer including carboxylic anhydride groups; a compound functioning as a thermoacid generator from which an acid is released when exposed to a thermal treatment; a photoreactive compound functioning as a photobase generator from which a base is formed upon exposure to one of light, X-rays, electron beams and ion beams; and a solvent; drying the chemical amplification resist; exposing the chemical amplification resist to one of light, X-rays, electron beams and ion beams; heating the chemical amplification resist; developing the chemical amplification resist with an aqueous-alkaline developer solution; and siliconizing the chemical amplification resist from a liquid phase.
Claim 3
Dependent Claim 31 words
The process according to claim 1 , which comprises forming the polymer with at least one acid-labile group selected from the group consisting of tert-alkyl esters, tert-butoxycarbonyloxy, acetal, tetrahydrofuranyl, and tetrahydropyranyl.
Claim 4
Dependent Claim 18 words
The process according to claim 1 , which comprises liberating a sulfonic acid from the thermo acid generator.
Claim 5
Dependent Claim 67 words
The process according to claim 1 , which comprises forming the thermoacid generator from at least one compound selected from the group consisting of a dialkyliodonium salt, a alkylaryliodonium salt, a diaryliodonium salt, a trialkylsulfonium salt of a sulfonate, a dialkylarylsulfonium salt of a sulfonate, a alkyldiarylsulfonium salt of a sulfonate, o-nitrobenzylsulfonate, a salt of a benzylthiolanium compound, a salt of a polyfluorinated butanesulfonate, and N-sulfonic esters.
Claim 6
Dependent Claim 16 words
The process according to claim 1 , which comprises forming an amine from the photobase generator.
Claim 7
Dependent Claim 51 words
The process according to claim 1 , which comprises forming the photobase generator from at least one compound selected from the group consisting of O-acyloxime, a benzyloxycarbonylamide derivative, a formamide derivative, a diarylmethanetrialkylammonium salt, o-nitrobenzyloxycarbonylcyclohexylamine, 2,6-dinitrobenzyloxycarbonylcyclohexylamine, a nifedipine derivative, and polymer-bound photobase generators based on one of the aforementioned base precursors.
Claim 8
Dependent Claim 31 words
The process according to claim 1 , which comprises adding an additive to the chemical amplification resist and selecting the additive from the group consisting of 9-anthracenemethanol acid and 9-hydroxy-9-fluorenecarboxylic acid.
Claim 9
Dependent Claim 28 words
The process according to claim 1 , which comprises irradiating the chemical amplification resist with UV light having a wavelength in a range of 1 to 400 nm.
Claim 10
Dependent Claim 19 words
The process according to claim 1 , which comprises performing the siliconizing step using a compound containing amino groups.
Claim 11
Dependent Claim 19 words
The process according to claim 1 , which comprises carrying out a thermal treatment before performing the siliconizing step.
Claim 12
Dependent Claim 23 words
The process according to claim 1 , which comprises performing the siliconizing step using a compound containing amino groups in an organic solvent.
Claim 13
Dependent Claim 19 words
The process according to claim 1 , which comprises carrying out a thermal treatment after performing the siliconizing step.
Claim 14
Dependent Claim 21 words
The process according to claim 1 , which comprises carrying out a thermal treatment before and after performing the siliconizing step.
Claim 15
Dependent Claim 19 words
The process according to claim 1 , which comprises forming the chemical amplification resist with at least one additive.
Claim 16
Dependent Claim 17 words
The process according to claim 1 , which comprises providing the carboxylic anhydride groups in latent form.

References Cited (Backward Citations)

EP0395917A2 Cited
US5234793A Cited
EP0425142A2 Cited
DE4226464A1 Cited
JPH07261393A Cited
US5851733A Cited
EP0874281A1 Cited
US6251558B1 Cited
EP0919867A2 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2007-03-09 2007-09-08 2008-03-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2011-03-09 2011-09-08 2012-03-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2015-03-09 2015-09-08 2016-03-09 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag