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US6990870B2 Expired / Lapsed US ⏱️ 0.0 years remaining

System for determining characteristics of substrates employing fluid geometries

Assignee: Canon Nanotechnologies Inc
•
Filing: 2004-08-20
•
Granted: 2006-01-31
•
Expires: 2024-08-20
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Abstract

Abstract The present invention provides a technique for determining characteristics of substrates, such as the presence of contaminants, shape, as well as the spatial relationships between spaced-apart substrates. The spatial relationships include distance and angular orientation, between first and second spaced apart substrates. The technique includes forming a volume of fluid on the second substrate, with the volume of fluid having an area associated therewith. The volume of fluid is compressed between the first and second substrates to effectuate a change in properties of the area, defining changed properties. The changed properties are sensed, and the characteristics of the first and second substrates are determined as a function of the changed properties.

Inventors

  • 👤 Byung J. Choi
  • 👤 Sidlgata V. Sreenivasan

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 05:47
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/0002; B; B82; B82Y; B82Y10/00; B82Y40/00; G03F7/70; G03F7/70483

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 137 words
A system to determine system conditions by measuring characteristics of a volume of fluid disposed between a first substrate, lying in a first plane, and a second substrate, lying in a second plane, said system comprising: a displacement mechanism to cause relative movement between said volume and one of said first and second substrates to effectuate a change in area of said first and second substrates in superimposition with said volume; a detector system to sense said change in area and produce signals carrying information concerning said change in area; a memory containing a look-up table of data relating differing shapes of said volume to differing processing conditions; and a processing system, in data communication with said memory, to receive said signals and compare said information with said data and produce information corresponding to said system conditions.
Claim 2
Independent Claim 137 words
A system to determine system conditions by measuring characteristics of a volume of fluid disposed between a first substrate, lying in a first plane, and a second substrate, lying in a second plane, said system comprising: a displacement mechanism to cause relative movement between said volume and one of said first and second substrates to effectuate a change in area of said first and second substrates in superimposition with said volume; a detector system to sense said change in area and produce signals carrying information concerning said change in area; a memory containing a look-up table of data relating differing shapes of said volume to differing processing conditions; and a processing system, in data communication with said memory, to receive said signals and compare said information with said data and produce information corresponding to said system conditions.
Claim 3
Dependent Claim 22 words
The system as recited in claim 1 wherein said processing conditions include a relative angular position between said first and second substrate.
Claim 4
Dependent Claim 22 words
The system as recited in claim 1 wherein said processing conditions including a relative parallel orientation of said first and second planes.
Claim 5
Dependent Claim 26 words
The system as recited in claim 1 wherein said processing conditions further includes a presence of a defect in one of said first and second substrates.
Claim 6
Dependent Claim 40 words
The system as recited in claim 1 wherein said processing conditions further includes a presence of a defect in one of said first and second substrates and distinguishing between said first and second substrates as a source of said defect.
Claim 7
Dependent Claim 27 words
The system as recited in claim 1 wherein said processing conditions further includes a presence of a particulate contaminant on one of said first and second substrates.
Claim 8
Dependent Claim 42 words
The system as recited in claim 1 wherein said processing conditions further includes a presence of a particulate contaminant on one of said first and second substrates and distinguishing between said first and second substrates as a source of said particulate contaminant.
Claim 9
Dependent Claim 21 words
The system as recited in claim 1 wherein said processing conditions further includes a distance between said first and second substrates.
Claim 10
Dependent Claim 27 words
The system as recited in claim 1 wherein said processor determines said processing conditions in response to said change in areas measured during a period of time.
Claim 11
Independent Claim 143 words
A system to determine processing conditions by measuring characteristics of a volume of imprinting material disposed between a first substrate, lying in a first plane, and a second substrate, lying in a second plane, said system comprising: a displacement mechanism to cause relative movement between said volume and one of said first and second substrates to effectuate a change in area of a portion of said first and second substrates in superimposition with said volume; a detector system to sense said change in area and produce signals carrying information concerning said change in area; a memory containing a look-up table of data relating differing shapes of said volume to differing processing conditions; and a processing system, in data communication with said memory, to receive said signals and compare said information with said data and determine one of said differing processing conditions associated therewith.
Claim 12
Independent Claim 143 words
A system to determine processing conditions by measuring characteristics of a volume of imprinting material disposed between a first substrate, lying in a first plane, and a second substrate, lying in a second plane, said system comprising: a displacement mechanism to cause relative movement between said volume and one of said first and second substrates to effectuate a change in area of a portion of said first and second substrates in superimposition with said volume; a detector system to sense said change in area and produce signals carrying information concerning said change in area; a memory containing a look-up table of data relating differing shapes of said volume to differing processing conditions; and a processing system, in data communication with said memory, to receive said signals and compare said information with said data and determine one of said differing processing conditions associated therewith.
Claim 13
Dependent Claim 23 words
The system as recited in claim 10 wherein said processing conditions situations include a relative angular position between said first and second substrate.
Claim 14
Dependent Claim 22 words
The system as recited in claim 10 wherein said processing conditions including a relative parallel orientation of said first and second planes.
Claim 15
Dependent Claim 27 words
The system as recited in claim 10 wherein said processing conditions further includes a presence of a particulate contaminant on one of said first and second substrates.
Claim 16
Dependent Claim 42 words
The system as recited in claim 10 wherein said processing conditions further includes a presence of a particulate contaminant on one of said first and second substrates and distinguishing between said first and second substrates as a source of said particulate contaminant.
Claim 17
Dependent Claim 21 words
The system as recited in claim 10 wherein said processing conditions further includes a distance between said first and second substrates.
Claim 18
Independent Claim 140 words
A system to determine processing conditions by measuring characteristics of a volume of imprinting material disposed between a first substrate, lying in a first plane, and a second substrate, lying in a second plane, said system comprising: a displacement mechanism to cause relative movement between said volume and one of said first and second substrates to effectuate a change in area of said first and second substrates in superimposition with said volume; a detector system to sense said change in area and produce signals carrying information concerning said change in area; a memory containing a look-up table of data relating differing shapes of said volume to differing processing conditions; and a processing system, in data communication with said memory, to receive said signals and compare said information with said data and determine one of said differing processing conditions associated therewith.
Claim 19
Independent Claim 140 words
A system to determine processing conditions by measuring characteristics of a volume of imprinting material disposed between a first substrate, lying in a first plane, and a second substrate, lying in a second plane, said system comprising: a displacement mechanism to cause relative movement between said volume and one of said first and second substrates to effectuate a change in area of said first and second substrates in superimposition with said volume; a detector system to sense said change in area and produce signals carrying information concerning said change in area; a memory containing a look-up table of data relating differing shapes of said volume to differing processing conditions; and a processing system, in data communication with said memory, to receive said signals and compare said information with said data and determine one of said differing processing conditions associated therewith.
Claim 20
Dependent Claim 68 words
The system as recited in claim 16 wherein said processing condition is one of a set of conditions selected from a set consisting essentially of a relative angular position between said first and second substrates, a relative parallel orientation of said first and second planes, a presence of a particulate contaminant on one of said first and second substrates, and a distance between said first and second substrates.
Claim 21
Dependent Claim 31 words
The system as recited in claim 16 wherein said processing conditions further includes a presence of a defect in one of said displacement mechanism, said first substrate and said second substrate.
Claim 22
Dependent Claim 50 words
The system as recited in claim 16 wherein said processing conditions further includes a presence of a defect in one of said displacement mechanism, said first substrate and said second substrate and distinguishing between said displacement mechanism, said first substrate and said second substrates as a source of said defect.

References Cited (Backward Citations)

US3527062A Cited
US3807027A Cited
US3807029A Cited
US3811665A Cited
US4062600A Cited
US4098001A Cited
DE2800476A1 Cited
US4155169A Cited
US4267212A Cited
US4202107A Cited
US4326805A Cited
US4337579A Cited
US4355469A Cited
US4414750A Cited
JPS58129074U Cited
US4552832A Cited
US4440804A Cited
US4544572A Cited
US4544572B1 Cited
US4610442A Cited
US4451507A Cited
JPH0224848Y2 Cited
US4512848A Cited
US4694703A Cited
US5785918A Cited
US4722878A Cited
JPH0470379B2 Cited
WO1987002935A1 Cited
EP0244884B1 Cited
US4724222A Cited
US4929083A Cited
US4959252A Cited
US4909151A Cited
US4763886A Cited
US4731155A Cited
US4772878A Cited
US5028366A Cited
JPH01196749A Cited
US4848179A Cited
US5063321A Cited
US4846931A Cited
US4883561A Cited
US4887283A Cited
JPH0292603A Cited
US5876550A Cited
US5171490A Cited
US5110514A Cited
US4964145A Cited
US5507411A Cited
US5073230A Cited
US5240550A Cited
US5126006A Cited
US5072126A Cited
US5218193A Cited
WO1992017883A1 Cited
US5155749A Cited
US5206983A Cited
US5952127A Cited
US5563702A Cited
US5270984A Cited
US5357122A Cited
US5392123A Cited
US5259926A Cited
US5277749A Cited
US5508527A Cited
US5204739A Cited
US5545367A Cited
US5452090A Cited
US5731981A Cited
US5601641A Cited
US5355219A Cited
US5726548A Cited
US5425848A Cited
US5348616A Cited
US5884292A Cited
US5414514A Cited
US5480047A Cited
US5900160A Cited
US5512131A Cited
US6180239B1 Cited
US6776094B1 Cited
US5753014A Cited
US5942871A Cited
US5523878A Cited
US5425964A Cited
US5515167A Cited
US5504793A Cited
EP0733455A2 Cited
US5849209A Cited
US6088103A Cited
US5808742A Cited
US5625193A Cited
US5724145A Cited
US6518168B1 Cited
US5566584A Cited
US5849222A Cited
US5825482A Cited
US5633505A Cited
US6125183A Cited
US6828244B2 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2009-01-30 2009-08-01 2010-01-31 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2013-01-30 2013-08-01 2014-01-31 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2017-01-30 2017-08-01 2018-01-31 $7700.00 Window Closed / Lapsed

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